Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 24 - August 2018

Technologist Forum, Tutorials, and Outreach Symposia

E. Ann Ellis Memorial Session

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Technologists’ Forum Special Topic Session: Specimen Preparation for Correlative FIB-SEM and XRM

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Technologists’ Forum Roundtable Session: Sample Preparation Strategies for

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Scanning Nanobeam Diffraction

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Entrepreneurship in the Microscopy Community

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Ultra-high Spatial Resolution EBSD: Transmission Kikuchi Diffraction (TKD) in the SEM

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Cryo-FIB: Overcoming the Hurdle of Sample Preparation for in situ Cryo-Electron Tomography

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Single-particle CryoEM: Data Processing Techniques for Obtaining Optimal Results

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How to Get Funding for Instrumentation When Budgets Are Tight (Parts I and II)

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Microscopy in the Classroom

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