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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 10 of 52

Instrumentation Sciences

A02.02 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope

Abstract

  • High Resolution Imaging and X-Ray Microanalysis at High Count Rate: The Supreme Achievement in Materials Characterization

  • R. Gauvin, D.C. Joy, N. Brodusch, H. Demers, P. Woo
  • Published online by Cambridge University Press:
    09 October 2013, pp. 360-361
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Nanocomposites

  • B.S. Patel, M. Watanabe
  • Published online by Cambridge University Press:
    09 October 2013, pp. 362-363
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • X-ray Quantitative Microanalysis with an Annular Silicon Drift Detector

  • H. Demers, N. Brodusch, D.C. Joy, P. Woo, R. Gauvin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 364-365
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Fine Structure of Core Loss Excitations in EELS by Monte Carlo Simulation

  • M. Attarian Shandiz, F. Salvat, R. Gauvin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 366-367
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Difference Between Secondary Electron Imaging In Variable Pressure SEM And Conventional SEM: Can They Ever Be The Same?

  • B.J. Griffin, D.C. Joy, J.R. Michael
  • Published online by Cambridge University Press:
    09 October 2013, pp. 368-369
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Layer Number Contrast of CVD-derived Graphene in Low Voltage Scanning Electron Microscopy

  • J. Xie, J.P. Spallas
  • Published online by Cambridge University Press:
    09 October 2013, pp. 370-371
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A02.03 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope

Abstract

  • Scanning Electron Microscopy With Slow Electrons

  • L. Frank, Š. Mikmeková, Z. Pokorná, I. Müllerová
  • Published online by Cambridge University Press:
    09 October 2013, pp. 372-373
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low-Energy Electron Diffractive Imaging Based on a Single-Atom Electron Source

  • C.-Y. Lin, I.-S. Hwang, W.-T. Chang, W.-H. Hsu, M.-T. Chang, Y.-S. Chen, T.-T. Tsong
  • Published online by Cambridge University Press:
    09 October 2013, pp. 376-377
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Combining Operando X-ray Absorption Spectroscopy and Sub-Ångstrom Environmental Electron Microscopy

  • E.A. Stach
  • Published online by Cambridge University Press:
    09 October 2013, pp. 378-379
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Future SEM Sees 3 Dimensions... Bringing Deconvolution Techniques to the Electron Microscope.

  • F. Boughorbel, X. Zhuge, P. Potocek, L. de Bruin, B. Lich
  • Published online by Cambridge University Press:
    09 October 2013, pp. 380-381
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A02.P1 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope

Abstract

  • Single-atom Tip as an Emitter of Gas Field Ion Source

  • W.-T. Chang, I.-S. Hwang, H.-S. Kuo, T.-Y. Fu, J.-L. Hou, C.-Y. Lin, T.-T. Tsong
  • Published online by Cambridge University Press:
    09 October 2013, pp. 382-383
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Novel Silicon Nanowire-based Electron Detector Utilized in Next Generation Scanning Electron Microscopes

  • M. Hajmirzaheydarali, M. Akbari, S. Mohajerzadeh
  • Published online by Cambridge University Press:
    09 October 2013, pp. 384-385
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low voltage STEM observation in the latest FE-SEM

  • N. Sakamoto, S. Takeuchi, K. Koyama, M. Sasajima, H. Sato
  • Published online by Cambridge University Press:
    09 October 2013, pp. 386-387
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Second and Third Order Aperture Aberrations of the Compensated Quadrupole Doublet

  • F.W. Martin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 388-389
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Hard-Soft Composites and Crystalline Materials

  • B.S. Patel, M. Watanabe
  • Published online by Cambridge University Press:
    09 October 2013, pp. 390-391
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A03.01 New Opportunities for In-situ Techniques and Instruments

Abstract

  • Exploiting a direct detection camera for in-situ microscopy

  • E.A. Stach, D. Zakharov, R.D. Rivas, P. Longo, M. Lent, A. Gubbens, C. Czarnik
  • Published online by Cambridge University Press:
    09 October 2013, pp. 392-393
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In-situ Raman Spectroscopy in a TEM

  • F.I. Allen, E. Kim, S.-G. Ryu, B. Ozdol, C.P. Grigoropoulos, A.M. Minor
  • Published online by Cambridge University Press:
    09 October 2013, pp. 394-395
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In-Situ Environmental Atom Probe Tomography for Studying Gas-Solid Reactions In Extreme Environments: Instrumentation and Results

  • S. Dumpala, S.R. Broderick, P.A. Bagot, K. Rajan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 396-397
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 10 of 52