Proceedings of Microscopy & Microanalysis 2016
Analytical and Instrumentation Science Symposia
Advances in FIB Instrumentation and Applications in Materials and Biological Sciences
Abstract
Flexible Grid Holder Enabling FIB-SEM Sample Prep and Analysis
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- 25 July 2016, pp. 162-163
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Localization of Subsurface Structures for Site-Specific Cryo-FIB Lift-Out Preparation of Solid-Liquid Interfaces
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- 25 July 2016, pp. 164-165
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Monolithic Multi-Grating Diffraction in a Convergent Electron Beam
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 166-167
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FIB sample preparation for X-ray microscopy and ROI target cross-sectioning
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- 25 July 2016, pp. 168-169
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Micromachining of Si3N4by Ga+-Ion Implantation and Dry Etching
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- 25 July 2016, pp. 170-171
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FIB Tomography of Bacterial Biofilms Grown on Gold and Polystyrene
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- 25 July 2016, pp. 172-173
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New Attempts on Preparing Tungsten FIB Sample
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- 25 July 2016, pp. 174-175
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Novel TEM Specimen Preparation Using Multi-Source Focused Ion Beams for Real-Time Electrostatic Biasing Studies
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- 25 July 2016, pp. 176-177
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Xe+ FIB Milling and Measurement of Amorphous Damage in Diamond
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- 25 July 2016, pp. 178-179
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Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam
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- 25 July 2016, pp. 180-181
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Fabrication of Frozen-Hydrated Sections by Focused Ion Beam(FIB) Method
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- 25 July 2016, pp. 182-183
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MEMS-based Heating Element forin-situDynamical Experiments on FIB/SEM Systems
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- 25 July 2016, pp. 184-185
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Anin situMethod for Preserving Buried Voids and Cracks During TEM Sample Preparation using FIB
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- 25 July 2016, pp. 186-187
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Novel Investigative Preparation of Human Hair
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- 25 July 2016, pp. 188-189
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Automatic FIB-SEM Preparation of Straight Pillars for Micro-Compression Testing
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- 25 July 2016, pp. 190-191
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The Application of Cryogenic Focused Ion Beam Scanning Electron Microscopy to Hydrogel Characterization.
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- 25 July 2016, pp. 192-193
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Quantification of Milling Rate and Reduction in Amorphous Damage using Low Energy, Small Spot, Argon Ion Milling for TEM Specimens prepared by FIB.
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- 25 July 2016, pp. 194-195
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Curtaining-Free Top-Down TEM Lamella Preparation from a Cutting Edge Integrated Circuit
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- 25 July 2016, pp. 196-197
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Applications of Correlative Microscopy to Physical and Biological Sciences
Abstract
Large-scale EM & Correlative Microscopy (Nanotomy & CLEM)
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- 25 July 2016, pp. 198-199
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Application of Ionic Liquid on Biological Samples in Correlative Optical Microscopy and Scanning Electron Microscopy.
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- 25 July 2016, pp. 200-201
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