Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Advanced Characterization of Energy-Related Materials

Abstract

Crystallization Processes of Amorphous GeSn Thin Films by Heat Treatment and Electron Beam Irradiation

Real-time Observation of Sintering Process of Carbon Supported Platinum Nanoparticles in Oxygen and Water through Environment TEM

In-situ Electron Diffraction Studies of Sodium Electrochemistry in MoS2

The Effect of Electron Beam Dosage in the Decomposition Behavior of Electrolytes Encapsulated Inside the Graphene Sheets Based on In Situ TEM Observation

In Situ TEM Observation on the Agglomeration of Nanoparticles in the Interface of SnO2

Electron Microscopy Study of ALD Protective Coating on the FeOF Electrode

PtBi Alloy Nanoparticles on Reduced Graphitic Oxide Support for Electrocatalysis

Combining in-Situ SEM with High Sensitivity Analytical TEM for Understanding the Degradation of Metallic Interconnects in SOFC

A Comparative TEM Study of Soot Particles Derived from Used Diesel and Gasoline Engine Oils

The Influence of pH Control of the Reaction Solution in the Growth of ZnO Films by CBD Technique for Solar Cell Applications

Understanding Hollow Metal Oxide Nanomaterial Formation with in situ Transmission Electron Microscopy

Electron Microscopy of Heterostructure for Solar Energy Recovery: ZnO Nanowires and Co3O4 Nanoparticles

Asymmetric Phase Transition Pathways During Li/Na Migration in 2D Materials

Microstructural Evolution and Oxidation Behavior of T91/T92 Steel upon Long-Term Steam Test

Investigating the Electrochemical Reversibility of Transition Metal Oxide Conversion Materials Through STEM-EELS

Highly Nonconductive Li-Ion Battery Components Successfully Imaged at Very Low Accelerating Voltages

Microstructure and Chemical Composition Analysis of Additive Manufactured Ni-Mn-Ga Parts Sintered in Different Conditions

Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

ToF-SIMS Investigations of Tip-Surface Chemical Interactions in Atomic Force Microscopy on a Combined AFM/ToF-SIMS Platform

Ion Beam Induced Current Measurements of Solar Cells with Helium Ion Microscopy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Advanced Characterization of Energy-Related Materials

Abstract