Microscopy and Microanalysis: Volume 13 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Volume 13 - Issue S03 - September 2007

Contents

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Research Article

Time Resolved Measurements of Ion- and Electron Currents in an ESEM
J Wagner, J Rattenberger, H Schröttner, M Schaffer, S Mitsche, A Zankel
Published online by Cambridge University Press:

07 September 2007, pp. 82-83
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Problems of the YAP:Ce Scintillator Use in Detectors of Signal Electrons in SEM.
P Wandrol, P Horák
Published online by Cambridge University Press:

07 September 2007, pp. 84-85
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Answering questions in materials science using FIB/SEM dual beam methods
C Holzapfel, F Soldera, F Mücklich
Published online by Cambridge University Press:

07 September 2007, pp. 86-87
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

New Tool for In-Situ Lift Out of TEM Samples
A Graff, C Große, M Simon, F Altmann
Published online by Cambridge University Press:

07 September 2007, pp. 88-89
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Investigation of Additional Thermally Induced Crystallisation in Amorphous Mg65Cu25Y10 Ribbon Material during Different TEM Preparation Procedures
C Mickel, A Gebert, A Teresiak, B Rellinghaus, P Schubert-Bischoff
Published online by Cambridge University Press:

07 September 2007, pp. 90-91
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Novel double-wedge sample preparation technique for quantitative TEM analysis of 3D structure in thin films and at buried interfaces
E Spiecker, V Radmilovic, U Dahmen
Published online by Cambridge University Press:

07 September 2007, pp. 92-93
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Structural analysis of cell-mineral aggregates in geomicrobiological samples by SEM
S Schaedler, A Kappler, C Burkhardt
Published online by Cambridge University Press:

07 September 2007, pp. 94-95
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Measurement of Carbon Layer Thickness with EPMA and the Thin Film Analysis Software STRATAGem
F Galbert
Published online by Cambridge University Press:

07 September 2007, pp. 96-97
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Using Enhanced SE Signal in the SEM for TEM Sample Thickness Determination
A Graff, M Simon, F Altmann
Published online by Cambridge University Press:

07 September 2007, pp. 98-99
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Conventional TEM Investigation Of The FIB Damage In Copper
D Kiener, T Jörg, M Rester, C Motz, G Dehm
Published online by Cambridge University Press:

07 September 2007, pp. 100-101
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Influence of FIB-acceleration Voltage on Lateral Damage of Silicon based TEM samples
U Muehle, J Steinhoff, L Hillmann
Published online by Cambridge University Press:

07 September 2007, pp. 102-103
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

FIB Preparation of Holes with Large Aspect Ratio
J Thomas, H Wendrock, B Arnold, D Lohse
Published online by Cambridge University Press:

07 September 2007, pp. 104-105
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Electron Tomography of Unstained Cell Sections Using a Half-Plane (Hilbert) Phase Plate
B Barton, R R Schröder
Published online by Cambridge University Press:

07 September 2007, pp. 106-107
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Quantification and Classification of Complex Microstructures by means of FIB/SEM-Nanotomography
F Muecklich, A Velichko
Published online by Cambridge University Press:

07 September 2007, pp. 108-109
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Multiphoton Fluorescence Imaging at Cryogenic Conditions
M Stark, D Dörr, F Ehrhart, J Schulz, J Baunach, A Katsen-Globa, A Ehlers, K König, H Zimmermann
Published online by Cambridge University Press:

07 September 2007, pp. 110-111
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Towards Quantitative Electron-Holographic Tomography
D Wolf
Published online by Cambridge University Press:

07 September 2007, pp. 112-113
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

In-Situ Growth of MnAs Nanocrystals in Si studied by Transmission Electron Microscopy
J Biskupek, U Kaiser, O Picht, W Wesch
Published online by Cambridge University Press:

07 September 2007, pp. 114-115
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Electron Tomographic Characterization of Er doped SiC
J Leschner, U Kaiser, J Biskupek, A Chuvilin, Ch Kübel
Published online by Cambridge University Press:

07 September 2007, pp. 116-117
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Solving the dynamic inversion problem
C T Koch
Published online by Cambridge University Press:

07 September 2007, pp. 118-119
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

CBED crystal polarity analysis of compound semiconductor nanostructures
E Spiecker, W Jäger, E Johnson, M Aagesen, C B Sørensen, P E Lindelof
Published online by Cambridge University Press:

07 September 2007, pp. 120-121
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Page 3 of 12

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3
4
5
6
7
Next »
Last

Microscopy and Microanalysis

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Volume 13 - Issue S03 - September 2007

Research Article

Time Resolved Measurements of Ion- and Electron Currents in an ESEM

Problems of the YAP:Ce Scintillator Use in Detectors of Signal Electrons in SEM.

Answering questions in materials science using FIB/SEM dual beam methods

New Tool for In-Situ Lift Out of TEM Samples

Investigation of Additional Thermally Induced Crystallisation in Amorphous Mg65Cu25Y10 Ribbon Material during Different TEM Preparation Procedures

Novel double-wedge sample preparation technique for quantitative TEM analysis of 3D structure in thin films and at buried interfaces

Structural analysis of cell-mineral aggregates in geomicrobiological samples by SEM

Measurement of Carbon Layer Thickness with EPMA and the Thin Film Analysis Software STRATAGem

Using Enhanced SE Signal in the SEM for TEM Sample Thickness Determination

Conventional TEM Investigation Of The FIB Damage In Copper

Influence of FIB-acceleration Voltage on Lateral Damage of Silicon based TEM samples

FIB Preparation of Holes with Large Aspect Ratio

Electron Tomography of Unstained Cell Sections Using a Half-Plane (Hilbert) Phase Plate

Quantification and Classification of Complex Microstructures by means of FIB/SEM-Nanotomography

Multiphoton Fluorescence Imaging at Cryogenic Conditions

Towards Quantitative Electron-Holographic Tomography

In-Situ Growth of MnAs Nanocrystals in Si studied by Transmission Electron Microscopy

Electron Tomographic Characterization of Er doped SiC

Solving the dynamic inversion problem

CBED crystal polarity analysis of compound semiconductor nanostructures

Microscopy and Microanalysis

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Volume 13 - Issue S03 - September 2007

Research Article