Microscopy and Microanalysis: Volume 27 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Automatic Diffraction Analysis and Lattice Fitting for Convergent-Beam Electron Diffraction Patterns in 4D-STEM

Refinement of crystal structure using ‘digital’ large angle convergent beam electron diffraction

Serial Electron Crystallography: New Developments for Data Collection and Analysis

Microscopy and Microanalysis for Real World Problem Solving

The use of an XRF glass database to assign a significance to forensic evidence

Home- and Laboratory-based Microscopy of Face Covering Materials

Quantitative X-ray mapping of Au-Ag ratios in native electrum from the Fire Creek epithermal vein deposit, Lander County, Nevada (USA)

Shining Through: Multi-Analytical Studies of the Tiffany Hartwell Memorial Window

ChemiSEM: multimodal approach for faster quantitative elemental mapping.

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

Describing Atomic-Level Fluxional Behavior in Nanoparticles

In-situ ETEM observation of intergranular oxidation of copper

In situ Transmission Electron Microscopy for Data-driven Modeling of Nanoparticle Evolution

Enabling Low-dose Liquid-phase TEM with Advanced Signal Processing, Machine Learning, and Molecular Simulation

Surface dynamics of catalytic nanoparticles in non-vacuum conditions

Advances in Analytical STEM-in-SEM

Characterization of Real Materials with Low Voltage STEM (30 kV): Current State and Challenges

An accurate Monte Carlo sampler for electron elastic scattering angular distributions between 50 eV and 300 keV

30 kV STEM-SEM – The Perfect Conditions for Transmission Spectroscopy?

Getting your Scanning Electron Microscope to Perform at Atomic Resolution Levels

Vendor Symposium

Thermo Scientific™ Tundra Cryo-TEM: 100kV Cryo-TEM dedicated for Single Particle Analysis

A Novel Event-Based Active Pixel Sensor for Cryo-EM Electron Counting

Falcon 4 performance validation by single event analysis

Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Microscopy and Microanalysis for Real World Problem Solving

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

Advances in Analytical STEM-in-SEM

Vendor Symposium