Analytical Sciences Symposia
Diffraction Imaging Across Disciplines
Automatic Diffraction Analysis and Lattice Fitting for Convergent-Beam Electron Diffraction Patterns in 4D-STEM
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1280-1281
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Refinement of crystal structure using ‘digital’ large angle convergent beam electron diffraction
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- 30 July 2021, pp. 1282-1284
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Serial Electron Crystallography: New Developments for Data Collection and Analysis
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- 30 July 2021, pp. 1286-1289
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Microscopy and Microanalysis for Real World Problem Solving
The use of an XRF glass database to assign a significance to forensic evidence
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- 30 July 2021, pp. 1290-1291
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Home- and Laboratory-based Microscopy of Face Covering Materials
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1292-1294
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Quantitative X-ray mapping of Au-Ag ratios in native electrum from the Fire Creek epithermal vein deposit, Lander County, Nevada (USA)
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- 30 July 2021, pp. 1296-1298
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Shining Through: Multi-Analytical Studies of the Tiffany Hartwell Memorial Window
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- 30 July 2021, p. 1300
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ChemiSEM: multimodal approach for faster quantitative elemental mapping.
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1302-1304
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New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Describing Atomic-Level Fluxional Behavior in Nanoparticles
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1306-1307
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In-situ ETEM observation of intergranular oxidation of copper
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1308-1311
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In situ Transmission Electron Microscopy for Data-driven Modeling of Nanoparticle Evolution
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- 30 July 2021, pp. 1312-1313
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Enabling Low-dose Liquid-phase TEM with Advanced Signal Processing, Machine Learning, and Molecular Simulation
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- 30 July 2021, pp. 1314-1315
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Surface dynamics of catalytic nanoparticles in non-vacuum conditions
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1316-1317
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Advances in Analytical STEM-in-SEM
Characterization of Real Materials with Low Voltage STEM (30 kV): Current State and Challenges
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- 30 July 2021, pp. 1318-1320
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An accurate Monte Carlo sampler for electron elastic scattering angular distributions between 50 eV and 300 keV
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- 30 July 2021, pp. 1322-1323
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30 kV STEM-SEM – The Perfect Conditions for Transmission Spectroscopy?
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- 30 July 2021, pp. 1324-1326
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Getting your Scanning Electron Microscope to Perform at Atomic Resolution Levels
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- 30 July 2021, pp. 1328-1329
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Vendor Symposium
Thermo Scientific™ Tundra Cryo-TEM: 100kV Cryo-TEM dedicated for Single Particle Analysis
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1330-1332
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A Novel Event-Based Active Pixel Sensor for Cryo-EM Electron Counting
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- 30 July 2021, pp. 1334-1336
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Falcon 4 performance validation by single event analysis
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1338-1339
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