Hostname: page-component-8448b6f56d-dnltx Total loading time: 0 Render date: 2024-04-19T21:53:38.011Z Has data issue: false hasContentIssue false

T- SEM: Quantitative Composition and Structure Analysis of FIB lamellae in SEM

Published online by Cambridge University Press:  22 July 2022

Meiken Falke*
Affiliation:
Bruker Nano GmbH, Berlin, Germany
Purvesh Soni
Affiliation:
Bruker Nano GmbH, Berlin, Germany
Anna Mogilatenko
Affiliation:
Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, Berlin Germany Humboldt Universität zu Berlin, Germany
*
*Corresponding author: meiken.falke@bruker.com

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Copyright
Copyright © Microscopy Society of America 2022

References

Brodu, E, Bouzy, E and Fundenberger, J, Microsc. Microanal. 23 (Suppl. 1) (2017) 530-531CrossRefGoogle Scholar
Terborg, R and Rohde, M, EMC Conf. Proceedings (2008), doi.org/10.1007/978-3-540-85156-1_317Google Scholar
Watanabe, M and Williams, D B, J. Microscopy 221 (2006) 89-109CrossRefGoogle Scholar