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Segmentation of “Important” Features in in High Dimensional Nanodiffraction Datasets

Published online by Cambridge University Press:  22 July 2022

Carter Francis  and
Paul Voyles
Carter Francis
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wi, US
Paul Voyles*
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wi, US
*
*Corresponding author: paul.voyles@wisc.edu

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 410 - 412
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Copyright
Copyright © Microscopy Society of America 2022

References

Im, S. et al. , Ultramicroscopy 195 (2018), p. 189–193.10.1016/j.ultramic.2018.09.005CrossRefGoogle Scholar
Krajnak, M. and Etheridge, J. Proceedings of the National Academy of Sciences of the United States of America 117 (2020), p. 27805–2781010.1073/pnas.2006975117CrossRefGoogle Scholar
Huang, S. et al. Ultramicroscopy 232 (2022) 11340510.1016/j.ultramic.2021.113405CrossRefGoogle Scholar
Voyles, P.M. and Muller, D.A., Ultramicroscopy 93 (2002), p. 147–159.10.1016/S0304-3991(02)00155-9CrossRefGoogle Scholar
Johnstone, D. N. et al. Journal of Applied Crystallography. 53 (2020), p.1293–1298.10.1107/S1600576720011103CrossRefGoogle Scholar
Savitzky, B. H., et al. Microscopy and Microanalysis, 27 (2021) p.712–743.10.1017/S1431927621000477CrossRefGoogle Scholar
Kong, H., Akakin, H. C., & Sarma, S. E. IEEE Transactions on Cybernetics, 43(6), (2013) p. 1719–1733.10.1109/TSMCB.2012.2228639CrossRefGoogle Scholar
pyXEM. (n.d.). https://doi.org/10.5281/zenado.2649351CrossRefGoogle Scholar
This research was supported by the Wisconsin Materials Research Science and Engineering Center (DMR-1720415).Google Scholar