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Retrofitting a Photoelectron Source: Improving Resolution & Functionality

Published online by Cambridge University Press:  22 July 2022

Frances Quigley ,
Clive Downing ,
Cormac McGuinness  and
Lewys Jones
Frances Quigley*
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland
Clive Downing
Affiliation:
Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland
Cormac McGuinness
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland
Lewys Jones
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland
*
*Corresponding author: fquigley@tcd.ie

Abstract

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Type
Microscopy Infrastructures: Architectures, Avenues and Access
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2934 - 2935
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Copyright
Copyright © Microscopy Society of America 2022

References

Klie, R., Reaching a new resolution standard with electron microscopy, Physics (College. Park. Md). 2 (2009) 85. https://doi.org/10.1103/physics.2.85.Google Scholar
Quigley, F., Mcbean, P., O'Donovan, P., Peters, J., Jones, L., Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging, Microsc. Microanal. Accepted (in press) (2022).10.1017/S1431927622000277CrossRefGoogle ScholarPubMed
Sawa, H., Anzai, M., Konishi, T., Tachibana, T., Hirayama, T., Development of a UHV-compatible Low-energy Electron Gun using the Photoelectric Effect, J. Vac. Soc. Japan. 60 (2017) 467–470. https://doi.org/10.3131/jvsj2.60.467.CrossRefGoogle Scholar
FQ is supported by a Trinity College Provost's Award scholarship. LJ is supported by Science Foundation Ireland grant number URF/RI/191637.Google Scholar