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Novel Applications of Focused Ion Beam Technique for Planetary Sample Analyses

Published online by Cambridge University Press:  01 August 2018

Z. Rahman ,
L. P. Keller ,
A. N. Nguyen ,
M. S. Thompson  and
Scott R. Messenger
Z. Rahman
Affiliation:
Science Department, Jacobs, NASA-JSC, USA.
L. P. Keller
Affiliation:
ARES, NASA-JSC, Houston, USA.
A. N. Nguyen
Affiliation:
Science Department, Jacobs, NASA-JSC, USA.
M. S. Thompson
Affiliation:
ARES, NASA-JSC, Houston, USA.
Scott R. Messenger
Affiliation:
ARES, NASA-JSC, Houston, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2120 - 2121
Copyright
© Microscopy Society of America 2018 

References

References:

[1] M. Schoonen, M., et al, Lunar & Planetary Science Conf 2018 #2951.Google Scholar
[2] Flynn, G. J., et al, Meteoritics Planet. Sci 2016 #6205.Google Scholar
[3] Nguyen, A. N., et al, Astrophysical J 818 2016) p 1.Google Scholar
[4] Keller, L. P., et al, Lunar & Planetary Science Conf 2018 #2594.Google Scholar