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A New Approach for 3D Quantitative STEM Using Defocus Corrected Electron Ptychography

Published online by Cambridge University Press:  22 July 2022

Ali Mostaed ,
Emanuela Liberti ,
Chen Huang ,
Angus I. Kirkland  and
Peter Nellist
Ali Mostaed*
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Emanuela Liberti
Affiliation:
Department of Materials, University of Oxford, Oxford, UK The Rosalind Franklin Institute, Harwell Campus, Didcot, UK
Chen Huang
Affiliation:
Department of Materials, University of Oxford, Oxford, UK The Rosalind Franklin Institute, Harwell Campus, Didcot, UK
Angus I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Oxford, UK The Rosalind Franklin Institute, Harwell Campus, Didcot, UK electron Physical Science Imaging Centre (ePSIC), Diamond Light Source, Didcot, UK
Peter Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
*
*Corresponding author: ali.mostaed@materials.ox.ac.uk

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 380 - 381
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Copyright
Copyright © Microscopy Society of America 2022

References

Bals, S et al. , MRS Bulletin 41 (2016), p. 525.CrossRefGoogle Scholar
Jones, L et al. , Nano Letters 14 (2014), p. 6336.CrossRefGoogle Scholar
Pennycook, TJ et al. , Ultramicroscopy 151 (2015), p. 160.CrossRefGoogle Scholar
Rodenburg, JM and Bates, RHT, Philosophical Transactions of the Royal Society a-Mathematical Physical and Engineering Sciences 339 (1992) p. 521.Google Scholar
Maiden, AM and Rodenburg, JM, Ultramicroscopy 109 (2009), p. 1256.CrossRefGoogle Scholar
AM acknowledge funding from the European Unions Horizon 2020 research and innovation program under Grant No. [823717] – ESTEEM3. The authors thank the Diamond Light Source for access the electron Physical Science Imaging Centre (Instrument E02, Proposal Nos. MG20431and MG22317) that contributed to the results presented here.Google Scholar