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Investigation of Chalcogenide Perovskite Thin Films Using Scanning Transmission Electron Microscopy (STEM)

Published online by Cambridge University Press:  22 July 2022

Michael Xu ,
Ida Sadeghi ,
Kevin Ye ,
Rafael Jaramillo  and
James M. LeBeau
Michael Xu
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
Ida Sadeghi
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
Kevin Ye
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
Rafael Jaramillo
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
James M. LeBeau*
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
*
*Corresponding author: lebeau@mit.edu

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2548 - 2549
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Copyright
Copyright © Microscopy Society of America 2022

References

Sun, Y.-Y. et al. , Nano Lett. 15 (2015), 581.CrossRefGoogle Scholar
Meng, W. et al. , Chem. Mater. 28 (2016), 821.CrossRefGoogle Scholar
Jaramillo, R., Ravichandran, J., APL Mater. 7 (2019), 100902.CrossRefGoogle Scholar
Sadeghi, I. et al. , Adv. Func. Mat. 31 (2021), 2105563.CrossRefGoogle Scholar
The authors acknowledge support from the National Science Foundation (NSF) under grant no. 1751736, "CAREER: Fundamentals of Complex Chalcogenide Electronic Materials,” and from the Office of Naval Research under grant no. N00014-18-1-2746. A portion of this project was funded by the Skolkovo Institute of Science and Technology as part of the MIT-Skoltech Next Generation Program. K.Y. acknowledges support by the NSF Graduate Research Fellowship, grant no. 1745302. J.M.L. and M.X. acknowledge support from the Air Force Office of Scientific Research (FA9550-20-0066) and the MIT Research Support Committee.Google Scholar