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Imaging Sensitive Catalyst Active Site Structure by 30 keV Electron Ptychography

Published online by Cambridge University Press:  22 July 2022

Michael J. Zachman ,
Hasnain Hafiz ,
Dong Young Chung ,
Vojislav Stamenkovic ,
Edward F. Holby  and
David A. Cullen
Michael J. Zachman*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Hasnain Hafiz
Affiliation:
Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM, USA
Dong Young Chung
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL, USA
Vojislav Stamenkovic
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL, USA The Samueli School of Engineering, University of California, Irvine, Irvine, CA, USA
Edward F. Holby
Affiliation:
Sigma Division, Los Alamos National Laboratory, Los Alamos, NM, USA
David A. Cullen
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
*
*Corresponding author: zachmanmj@ornl.gov

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 484 - 486
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Copyright
Copyright © Microscopy Society of America 2022

References

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Research sponsored by the Hydrogen and Fuel Cell Technologies Office, Office of Energy Efficiency and Renewable Energy, US Department of Energy (DOE). Electron microscopy was conducted at the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility.Google Scholar