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Identifying Possible Two-Level-System Sources in Superconducting Qubit with Advanced Electron Microscopy
Published online by Cambridge University Press: 22 July 2022
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- Type
- Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Oliver, WD and Welander, PB, MRS Bull. 38(10) (2013), p. 816. doi: 10.1557/mrs.2013.229CrossRefGoogle Scholar
Romanenko, A and Schuster, D, Phys. Rev. Lett. 119(26), (2017), p. 1. doi:10.1103/PhysRevLett.119.264801CrossRefGoogle Scholar
This work was supported by the U.S. Department of Energy, Office of Science, National Quantum Information Science Research Centers, Superconducting Quantum Materials and Systems Center (SQMS) under the contract No. DE-AC02-07CH11359. All electron microscopy and related work were performed using instruments in the Sensitive Instrument Facility in Ames Lab. The Ames Laboratory is operated for the U.S. Department of Energy by Iowa State University under Contract No. DE-AC02-07CH11358.Google Scholar
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