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A Feasible Surface Patterning Method for SEM-DIC: Achieving High-Resolution In Situ Mapping of Local Strain and Microstructure to Reveal the Effect of Slip Transfer on Shear Strain Near Grain Boundaries

Published online by Cambridge University Press:  16 May 2022

Hao Ding Open the ORCID record for Hao Ding [Opens in a new window] ,
Xiping Cui ,
Yuchen Wang ,
Delong Cai ,
Zhiqi Wang ,
Yuanyuan Zhang ,
Lujun Huang  and
Lin Geng
Hao Ding
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, P.R. China
Xiping Cui*
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, P.R. China Center for Analysis, Measurement and Computing, Harbin Institute of Technology, Harbin 150001, P.R. China
Yuchen Wang
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, P.R. China
Delong Cai
Affiliation:
Lab & Equipment Administration Department, Harbin Institute of Technology, Harbin 150001, P.R. China
Zhiqi Wang
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, P.R. China
Yuanyuan Zhang
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, P.R. China
Lujun Huang
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, P.R. China
Lin Geng
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, P.R. China
*
*Corresponding author: Xiping Cui, E-mail: cuixiping@hit.edu.cn
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Abstract

This paper exploited an alternative approach to prepare high-quality speckle patterns by uniformly dispersing nano-silica particles onto sample surfaces, helping digital image correlation (DIC) acquire the maximum spatial resolution of local strain up to 92 nm. A case study was carried out by combining this speckle pattern fabrication method with SEM-DIC and electron backscattering diffraction (EBSD). Thus, in situ mapping of local strain with ultra-high spatial resolution and microstructure in commercially pure titanium during plastic deformation could be achieved, which favored revealing the effect of slip transfer on shear strain near grain boundaries. Moreover, the slip systems could be easily identified via the combination of the SEM-DIC and EBSD techniques even though no obvious deformation trace was captured in secondary electron images. Additionally, the complex geometric compatibility factor $( {m}^{\prime}_c)$ relating to geometric compatibility factors (mʹ) and Schmid factors was proposed to predict the shear strain (εxy) at grain boundaries.

Keywords

geometric compatibility factorlocal strainSEM-DICslip transferspeckle pattern
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 28 , Issue 6 , December 2022 , pp. 1931 - 1944
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Copyright
Copyright © The Author(s), 2022. Published by Cambridge University Press on behalf of the Microscopy Society of America

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Footnotes

†

These authors contributed equally to this work.

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