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Deep Learning as a Tool for Image Denoising and Drift Correction

Published online by Cambridge University Press:  05 August 2019

Rama K. Vasudevan  and
Stephen Jesse
Rama K. Vasudevan*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Stephen Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
*
*Corresponding author: vasudevanrk@ornl.gov

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 190 - 191
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]This work was conducted at and supported by the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility.Google Scholar