No CrossRef data available.
Article contents
The Case for Lower Voltage TEMs: A 100 keV FEG for High Resolution Microscopy
Published online by Cambridge University Press: 22 July 2022
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Technical Advances in Cryo-EM
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Duncan, CJR, Muller, DA and Maxson, JM, Phys. Rev. Applied 14 (2022), p. 014060.CrossRefGoogle Scholar
El-Gomati, M. et al. , J. Vac. Sci. Technol. B 39(6) (2021), p. 062804-1. doi: 10.1116/6.0001275.CrossRefGoogle Scholar
The work presented here has been partly funded by generous grants from: Innovate UK grant no. 103806, the Medical Research Council grants; MC_U105184322, MC_UP_120117, the Welcome Trust Fund Nos. 22056/B/20/Z and EPSRC R122522.Google Scholar
You have
Access