No CrossRef data available.
Article contents
Autonomous Detection and Identification of Defects in Nanoscale Devices using Electron Diffraction Imaging
Published online by Cambridge University Press: 22 July 2022
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927622006973/resource/name/firstPage-S1431927622006973a.jpg)
- Type
- Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Smith, DJ, Progress in Crystal Growth and Characterization of Materials 66 (2020), p. 100498.CrossRefGoogle Scholar
Voulodimos, A et al. , Deep Learning for Computer Vision: A Brief Review, Computational Intelligence and Neuroscience (2018), p. 7068349.CrossRefGoogle ScholarPubMed
Work supported by Intel and Grainger College of Engineering, University of Illinois.Google Scholar