Hostname: page-component-8448b6f56d-dnltx Total loading time: 0 Render date: 2024-04-20T08:36:14.765Z Has data issue: false hasContentIssue false

Are vacancies in field ion microscopy artefacts? A DFT study

Published online by Cambridge University Press:  22 July 2022

Shyam Katnagallu*
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
Christoph Freysoldt
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
Joerg Neugebauer
Affiliation:
Computational Materials design, Max-Planck-Institut für Eisensforschung, Düsseldorf, Germany
*
*Corresponding author: s.katnagallu@mpie.de

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
On Demand - Expanding the Limits of Atom Probe Tomography
Copyright
Copyright © Microscopy Society of America 2022

References

Vurpillot, F., Gilbert, M., Deconihout, B., Towards the three-dimensional field ion microscope, Surf. Interface Anal. 39 (2007) 273277. https://doi.org/10.1002/sia.2490.CrossRefGoogle Scholar
Speicher, C.A., Pimbley, W.T., Attardo, M.J., Galligan, J.M., Brenner, S.S., Observation of vacancies in the field-ion microscope, Phys. Lett. 23 (1966) 194196. https://doi.org/10.1016/0031-9163(66)90860-2.CrossRefGoogle Scholar
Page, T.F., Ralph, B., The occurrence of field-induced surface vacancies on iridium field-ion microscope specimens, Surf. Sci. 36 (1973) 928. https://doi.org/10.1016/0039-6028(73)90243-4.CrossRefGoogle Scholar
Morgado, F.F., Katnagallu, S., Freysoldt, C., Klaes, B., Vurpillot, F., Neugebauer, J., Raabe, D., Neumeier, S., Gault, B., Stephenson, L.T., Revealing atomic-scale vacancy-solute interaction in nickel, Scr. Mater. 203 (2021) 114036. https://doi.org/10.1016/j.scriptamat.2021.114036.CrossRefGoogle Scholar
Freysoldt, C., Mishra, A., Ashton, M., Neugebauer, J., Generalized dipole correction for charged surfaces in the repeated-slab approach, Phys. Rev. B. 102 (2020) 45403. https://doi.org/10.1103/PhysRevB.102.045403.CrossRefGoogle Scholar