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Where are the geometrically necessary dislocations accommodating small imprints?

Published online by Cambridge University Press:  31 January 2011

M. Rester ,
C. Motz  and
R. Pippan
M. Rester*
Affiliation:
Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Austria
C. Motz
Affiliation:
Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Austria
R. Pippan
Affiliation:
Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Austria
*
a) Address all correspondence to this author. e-mail: martin.rester@stud.unileoben.ac.at
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Abstract

Electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM) analyses of small indentations in copper single crystals exhibit only slight changes of the crystal orientation in the surroundings of the imprints. Far-reaching dislocations might be the reason for these small misorientation changes. Using EBSD and TEM technique, this work makes an attempt to visualize the far-propagating dislocations by introducing a twin boundary in the vicinity of small indentations. Because dislocations piled up at the twin boundary produce a misorientation gradient, the otherwise far-propagating dislocations can be detected.

Keywords

CuNanoindentationTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 24 , Issue 3 , March 2009 , pp. 647 - 651
Copyright
Copyright © Materials Research Society 2009

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