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Thickness dependence of microstructure and critical current density of Yba2Cu3O7−δ on rolling-assisted biaxially textured substrates

Published online by Cambridge University Press:  31 January 2011

K. J. Leonard ,
A. Goyal ,
D. M. Kroeger ,
J. W. Jones ,
S. Kang ,
N. Rutter ,
M. Paranthaman ,
D. F. Lee  and
B. W. Kang
K. J. Leonard
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
A. Goyal
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
D. M. Kroeger
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
J. W. Jones
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
S. Kang
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
N. Rutter
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
M. Paranthaman
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
D. F. Lee
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
B. W. Kang
Affiliation:
Department of Physics, Pohang University of Science & Technology, Pohang, South Korea
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Abstract

The change in microstructure associated with the decrease in critical current density (Jc) of Yba2Cu3O7−δ (YBCO) films with increasing thickness was examined. Samples of pulse laser deposited YBCO films varying in thickness from 0.19 to 3.0 μm on rolling-assisted biaxially textured substrates with an architecture of CeO2/YSZ/CeO2/Ni were prepared by tripod polishing for cross-sectional electron microscopy. More randomly oriented grains in the upper portion of the YBCO film surface were observed with increasing film thickness, resulting in less cube texture. In addition, increases in mismatch across the boundaries of the c-axis grains with increasing time during deposition, along with the development of BaCeO3 and Y2BaCuO5 phases at the YBCO/CeO2 interface, contributed to the degradation of film properties. Surface outgrowths of the YBCO film were examined as well as the defect structures and second-phase formations within the films.

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 5 , May 2003 , pp. 1109 - 1122
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1.Masur, L., Parker, D., Tanner, M., Podtburg, E., Buczek, D., Scudiere, J., Caracino, P., Spreafico, S., Corsaro, P., and Nassi, M., IEEE Trans. Appl. Supercond. 11, 3256 (2001).CrossRefGoogle Scholar
2.Stovall, J.P., Demko, J.A., Fisher, P.W., Gouge, M.J., Lue, J.W., Sinha, U.K., Armstrong, J.W., Hughey, R.L., Lindsay, D., Tolbert, J.C., IEEE Trans. Appl. Supercond. 11, 2467 (2001).Google Scholar
3.Wu, X.D., Foltyn, S.R., Arendt, P.N., Blumenthal, W.R., Campbell, I.H., Cotton, J.D., Coulter, J.Y., Hults, W.L., Maley, M.P., Safar, H.F., and Smith, J.L., Appl. Phys. Lett. 67, 2397 (1995).Google Scholar
4.Goyal, A., Norton, D.P., Budai, J.D., Paranthaman, M., Specht, E.D., Kroeger, D.M., Christen, D.K., He, Q., Saffian, B., List, F.A., Lee, D.F., Martin, P.M., Klabunde, C.E., Hatfield, E.C., Sikka, V.K., Appl. Phys. Lett. 69, 1795 (1996).CrossRefGoogle Scholar
5.Goyal, A., Norton, D.P., Christen, D.K., Specht, E.D., Paranthaman, M., Kroeger, D.M., Budai, J.D., He, Q., List, F.A., Feenstra, R., Kerchner, H.R., Lee, D.F., Hatfield, E.C., Martin, P.M., Mathis, J., and Park, C., Appl. Supercond. 4, 403 (1996); J.D. Budai, D.K. Christen, A. Goyal, Q. He, D.M. Kroeger, D.F. Lee, F.A. List, D.P. Norton, M. Paranthaman, B.C. Sales, and E.D. Specht, U.S. Patent 5 968 877 (1999).CrossRefGoogle Scholar
6.Kang, B.W., Goyal, A., Lee, D.F., Mathis, J.E., Specht, E.D., Martin, P.M., Kroeger, D.M., Paranthaman, M., Sathyamurthy, S., J. Mater. Res. 17, 1750 (2002).Google Scholar
7.Develos, K.D., Yamasaki, H., Sawa, A., and Nakagawa, Y., Physica C 361, 121 (2001).CrossRefGoogle Scholar
8.Vasiliev, A.L., Linehan, D.S., Kvam, E.P., Hou, L., and McElfresh, M.W., Phsyica C 289, 243 (1997).CrossRefGoogle Scholar
9.Foltyn, S.R., Arendt, P.N., Dowden, P.C., DePaula, R.F., Groves, J.R., Coulter, J.Y., Jia, Q., Maley, M.P., Peterson, D.E., IEEE Trans. Appl. Supercond. 9, 1519 (1999).CrossRefGoogle Scholar
10.Foltyn, S.R., Jia, W.X., Arendt, P.N., Kinder, L., Fan, Y., Smith, J.F., Appl. Phys. Lett. 75, 3692 (1999).CrossRefGoogle Scholar
11.Foltyn, S.R., Peterson, E.J., Coulter, J.Y., Arendt, P.N., Jia, Q.X., Dowden, P.C., Maley, M.P., Wu, X.D., and Peterson, D.E., J. Mater. Res. 12, 2941 (1997).CrossRefGoogle Scholar
12.Sievers, S., Mattheis, F., Krebs, H.U., and Freyhardt, H.C., J. Appl. Phys. 78, 5545 (1995).Google Scholar
13.Lee, S.H., Bae, S.C., Kang, J.G., Lee, J.J., Shin, H.J., and Ku, J.K., J. Appl. Phys. 70, 5661 (1991).Google Scholar
14.Wördenweber, R., Supercond. Sci. Technol. 12, 6, R86 (1999).Google Scholar
15.Granozio, F. Miletto and Uccio, U. Scotti di, J. Cryst. Growth 174, 409 (1997).Google Scholar
16.Zhang, X.F., Kung, H.H., Foltyn, S.R., Jia, Q.X., Peterson, E.J., and Peterson, D.E., J. Mater. Res. 14, 1204 (1999).Google Scholar
17.Hwang, D.M., Venkatesan, T., Chang, C.C., Nazar, L., Wu, X.D., Inam, A., Hegde, M.S., Appl. Phys. Lett. 54, 1702 (1989).Google Scholar
18.Hamet, J.F., Mercey, B., Hervieu, M., Poullain, G., and Raveau, B., Physica C 198, 293 (1992).Google Scholar
19.Bdikin, I.K., Mozhaev, P.B., Ovsyannikov, G.A., Komissinski, P.V., and Kotelyanskii, I.M., Physica C 377, 26 (2002).Google Scholar
20.Eibl, O. and Roas, B., J. Mater. Res. 15, 2620 (1990).Google Scholar
21.Endo, T., Itoh, K., Horie, M., Itoh, K., Hirate, N., Yamada, S., Tada, M., and Sano, S., Physica C 333, 181 (2000).Google Scholar
22.Holesinger, T.G., Foltyn, S.R., Arendt, P.N., Jia, Q.X., Dowden, P.C., DePaula, R.F., Groves, J.R., IEEE Trans. Appl. Supercond. 11, 3359 (2001).Google Scholar
23.Uccio, U. Scotti di, Granozio, F. Miletto, Chiara, A. Di, Tafuri, F., Lebedev, O.I., Verbist, K., and Tendeloo, G. van, Physica C 321, 162 (1999).Google Scholar
24.Verbist, K., Vasiliev, A.L., and Van Tendeloo, G., Appl. Phys. Lett. 66, 1424 (1995).Google Scholar
25.Catana, A., Broom, R.F., Bednorz, J.G., Mannhart, J., and Schlom, D.G., Appl. Phys. Lett. 60, 1016 (1992).CrossRefGoogle Scholar
26.Tian, Y.J., Guo, L.P., Li, L., Zhou, Y.Q., Yang, Y., Zhao, Z.X., Xu, S.F., Lu, H.B., Zhou, Y.L., Chen, Z.H., Cui, D.F., and Yang, G.Z., Appl. Phys. Lett. 65, 234 (1994).CrossRefGoogle Scholar
27.Holesinger, T.G., Foltyn, S.R., Arendt, P.N., Kung, H., Jia, Q.X., Dickerson, R.M., Dowden, P.C., DePaula, R.F., Groves, J.R., and Coulter, J.Y., J. Mater. Res. 15, 1110 (2000).Google Scholar
28.Yang, C-Y., Babcock, S.E., Goyal, A., Paranthaman, M., List, F.A., Norton, D.P., Kroeger, D.M., and Inchinose, A., Physica C 307, 87 (1998).CrossRefGoogle Scholar
29.Park, J.H. and Lee, S.Y., Physica C 314, 112 (1999).Google Scholar
30.Ayache, J. and Albarède, P.H., Ultramicroscopy 60, 195 (1995).CrossRefGoogle Scholar
31.Benedict, J.P., Anderson, R., Klepeis, S.J., Vandygrift, W.G., and Orndorff, M.S., Application Note No. 590–0002 (South Bay Technology Inc., 1120 Via Callejon, San Clemente, CA 92673).Google Scholar
32.Benedict, J.P., Anderson, R., and Klepeis, S.J., Application Note No. 590–0001 (South Bay Technology Inc., 1120 Via Callejon, San Clemente, CA 92673).Google Scholar
33.Hendricks, D., South Bay Technology Inc. (personal communication).Google Scholar
34.Develos, K.D., Yamasaki, H., Sawa, A., Nakagawa, Y., Oshima, S., and Mukaida, M., Physica C 357, 1353 (2001).CrossRefGoogle Scholar
35.Chang, C.C., Wu, X.D., Ramesh, R., Xi, X.X., Ravi, T.S., Venkatesan, T., Hwang, D.M., Muenchausen, R.E., Foltyn, S., and Nogar, N.S., Appl. Phys. Lett. 57, 1814 (1990).Google Scholar
36.Catana, A., Bednorz, J.G., Gerber, C., Mannhart, J., and Schlom, D.G., Appl. Phys. Lett. 63, 553 (1993).Google Scholar
37.Schlom, D.G., Anselmetti, D., Bednorz, J.G., Gerber, C.H., and Mannhart, J. in Evolution of Surface and Thin-Film Microstructure, edited by Atwater, H.A., Chason, E.H., Grabow, M.L., and Lagally, (MRS Symp. Proc. 280, Pittsburgh, PA, 1993), 341.Google Scholar
38.Zhai, H.Y., Rusakova, I., Fairhurst, R., and Chu, W.K., Philos. Mag. Lett. 81, 683 (2001).Google Scholar
39.Broussard, P.R., Allen, L.H., Cestone, V.C., and Wolf, S.A., J. Appl. Phys. 74, 446 (1993).Google Scholar
40.Bals, S., Tendeloo, G. Van, Rijinders, G., Blank, D.H.A., Leca, V., and Salluzzo, M., Physica C 372, 711 (2002).CrossRefGoogle Scholar