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A TEM study of the microstructures formed during the crystallization of Ni–Zr metallic glasses

Published online by Cambridge University Press:  31 January 2011

R. Allem
Affiliation:
Département de Genie Metallurgique, Ecole Polytechnique de Montréal, C.P. 6079, Succursale A, Montréal, Quebec, Canada H3C 3A7
G. L'Espérance
Affiliation:
Département de Genie Metallurgique, Ecole Polytechnique de Montréal, C.P. 6079, Succursale A, Montréal, Quebec, Canada H3C 3A7
Z. Altounian
Affiliation:
Physics Department and the Centre for the Physics of Materials, McGill University, 3600 University Street, Montréal, Quebec, Canada H3A 2T8
J.O. Ström-Olsen
Affiliation:
Physics Department and the Centre for the Physics of Materials, McGill University, 3600 University Street, Montréal, Quebec, Canada H3A 2T8
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Abstract

The microstructure of two metastable crystalline phases, which are formed during the first step of the crystallization process in Ni–Zr metallic glasses, was investigated by transmission electron microscopy. For the composition Ni33Zr67, crystallites with average size of 150 nm having the face-centered cubic E93 structure are formed. For the Ni42Zr58 composition, 100 nm size crystallites with a simple cubic unit cell, space group Pa3 are formed. The microstructure of the crystallites in the early stage of crystallization of the two phases is similar to globular morphology and internal striations.

Type
Articles
Copyright
Copyright © Materials Research Society 1991

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References

1Altounian, Z., Batalla, E., and Ström-Olsen, J. O., J. Appl. Phys. 61, 149 (1987).CrossRefGoogle Scholar
2Kirkpatrick, M. E., Bailey, D. M., and Smith, J. F., Acta Cryst. 15, 894 (1962).CrossRefGoogle Scholar
3Feng, Y. C., Kuo, K. H., Hei, Z. K., and Wu, Y. K., Philos. Mag. A56, 757 (1987).CrossRefGoogle Scholar
4Edington, J. W., in Practical Electron Microscopy in Materials Science (Eindhoven, 1976), p. 90.Google Scholar