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Single-crystal structure refinement of four compounds in the Y1−xPrxBa2Cu3−yAlyO7−δ system

Published online by Cambridge University Press:  31 January 2011

A. Meden
Affiliation:
Department of Chemistry, University of Ljubljana, Slovenia
E. Holzinger-Schweiger
Affiliation:
Institute of Solid State Physics, Graz University of Technology, Austria
G. Leising
Affiliation:
Institute of Solid State Physics, Graz University of Technology, Austria
S. Pejovnik
Affiliation:
National Institute of Chemistry, Ljubljana, Slovenia
L. Golič
Affiliation:
Department of Chemistry, University of Ljubljana, Slovenia
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Abstract

X-ray single crystal diffraction data were used for structural refinement of the title compounds with different x (0.15, 0.27, 0.49, and 0.89). Crystals were grown in alumina crucibles using the self-flux method. Aluminum, which originates from the crucibles, substitutes only Cu(1), and thus induces tetragonal symmetry which was observed in all four crystals. The main structural effect of praseodymium is an increased separation of superconducting layers. Substituent concentrations (x and y in the formula) have been refined and compared with the values obtained by EDX (energy dispersive x-ray analysis) in an electron microscope. It was indicated that the refined values of Y: Pr ratio and the oxygen content are more reliable than those obtained by EDX while the refinement is less sensitive for Cu(1): Al ratio, and this value is more uncertain. This is in accordance with the result of wet chemical analysis.

Type
Articles
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1.Radousky, H.B., J. Mater. Res. 7, 1917 (1992).CrossRefGoogle Scholar
2.Neumeier, J.J., Bjørnholm, T., Maple, M.B., Rhyne, J.J., and Gotas, J.A., Physica C 166, 191 (1990).CrossRefGoogle Scholar
3.Siegrist, T., Schneemeyer, L.F., Waszczak, J.V., Singh, N.P., Opila, R.L., Batlogg, B., Rupp, L.W., and Murphy, D.W., Phys. Rev. B 36, 8365 (1987).CrossRefGoogle Scholar
4.Sato, S., Nakada, I., Kohara, T., Oda, Y., and Daidoji, H., Acta Crystallogr. C 45, 347 (1989).CrossRefGoogle Scholar
5.Jiang, X., Wochner, P., Moss, S.C., and Zschack, P., Phys. Rev. Lett. 67, 2167 (1991).CrossRefGoogle Scholar
6.Christensen, A. N., Hazell, R.G., and Grundvig, S., Acta Chem. Scand. 46, 343 (1992).CrossRefGoogle Scholar
7.Kaiser, D.L., Hotzberg, F., Scott, B.A., and McGuire, T.R., Appl. Phys. Lett. 51, 1040 (1987).CrossRefGoogle Scholar
8.Holzinger-Schweiger, E. and Leising, G., Physica C 224, 185 (1994).CrossRefGoogle Scholar
9.Wang, H. and Robertson, B.E., Structure and Statistics in Crystallography, edited by Wilson, A.J.C. (Adenine Press, New York, 1985).Google Scholar
10.Hall, S.R., Flack, H.D., and Stewart, J.M., editors, XTAL 3.2, University of Western Australia, Perth (1992).Google Scholar