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Revealing the mechanism of the early stages of Ni–W RABiTS oxidation

Published online by Cambridge University Press:  31 January 2011

Andrey V. Blednov ,
Oleg Yu. Gorbenko ,
Dmitriy P. Rodionov  and
Andrey R. Kaul
Andrey V. Blednov*
Affiliation:
Department of Materials Science, Moscow State University, 119991 Moscow, Russia
Oleg Yu. Gorbenko
Affiliation:
Department of Chemistry, Moscow State University, 119991 Moscow, Russia
Dmitriy P. Rodionov
Affiliation:
Institute of Metal Physics, Ural Division, Russian Academy of Sciences, 620219 Yekaterinburg, Russia
Andrey R. Kaul
Affiliation:
Department of Chemistry, Moscow State University, 119991 Moscow, Russia
*
a)Address all correspondence to this author. e-mail: blednov@inorg.chem.msu.ru
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Abstract

The early stages of surface oxidation of biaxially textured Ni–W tapes were studied using thermodynamic calculations along with experimental tape oxidation at low P(O2). Tape phase and chemical composition, surface morphology, and roughness were examined using x-ray diffraction (XRD), energy-dispersive x-ray analysis (EDX), secondary ion mass spectroscopy (SIMS), x-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). For a Ni0.95W0.05 alloy tape, the precise position of the tape oxidation line in P(O2)–T coordinates was established. This line includes a break at T ≈ 650 °C that originates from the change of the W oxidation mechanism from internal oxidation to oxidation on a free surface accompanied by segregation of the alloy components in the tape near-surface region. The surface roughness of a polished tape increased drastically during internal oxidation of W; further tape oxidation did not affect the integral roughness parameters, but introduced numerous small (˜;100 nm) features on the tape surface comprising NiO precipitates.

Keywords

OxidationNiW
Type
Articles
Information
Journal of Materials Research , Volume 25 , Issue 12 , December 2010 , pp. 2362 - 2370
Copyright
Copyright © Materials Research Society 2010

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Footnotes

b)

Deceased.

References

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