Hostname: page-component-848d4c4894-v5vhk Total loading time: 0 Render date: 2024-06-15T19:06:50.715Z Has data issue: false hasContentIssue false
  • English
  • Français

Residual stress fields in sol-gel-derived thin TiO2 layers

Published online by Cambridge University Press:  31 January 2011

D. H. J. Teeuw ,
M. de Haas  and
J.Th. M. De Hosson
D. H. J. Teeuw
Affiliation:
Laboratory of Applied Physics, Materials Science Center and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
M. de Haas
Affiliation:
Laboratory of Applied Physics, Materials Science Center and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
J.Th. M. De Hosson
Affiliation:
Laboratory of Applied Physics, Materials Science Center and Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands
Get access

Abstract

This paper discusses the induction of residual stresses during the curing process of thin titania layers, which are derived using a sol-gel process. During this process, stresses may build up in the spinning stage, the drying stage, and the consolidation stage. The magnitude and character of these stresses depend heavily on the morphology of the layers in the various stages and the processing conditions. Dried layers are densified using two different processes, conventional furnace heating and laser heating. X-ray analysis and scanning electron microscopy are used as tools to study crystallization, grain growth, phase transformation, and the evolution of residual stress fields in the thin titania layers. Through an extensive study of the residual stress state in the layers, more insight is gained in the evolution of stresses during the curing process of sol-gel-derived thin titania layers.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 5 , May 1999 , pp. 1896 - 1903
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Ohya, Y., Saiki, H., Tanaka, T., and Takahashi, Y., J. Am. Ceram. Soc. 79, 825 (1996).CrossRefGoogle Scholar
2.Brinker, C.J. and Scherrer, G.W., Sol-Gel Science (Academic Press, San Diego, CA, 1990).Google Scholar
3.van Looyengoed, F., Thesis, Rijksuniversiteit Groningen (1996), p. 19.Google Scholar
4.Cullity, B. D., Elements of X-ray Diffraction (Addison-Wesley, Reading, MA, 1978), p. 447.Google Scholar
5.Montoya, I.A., Viveros, T., Dominguez, J. M., Canales, L.A., and Schifter, I., Catal. Lett. 15, 207 (1992).CrossRefGoogle Scholar
6.Takahashi, Y. and Matsuoka, Y., J. Mater. Sci. 23, 225 (1988).Google Scholar
7.Bersani, D., Capelletti, R., Lottici, P. P., Gnappi, G., and Montenero, A., Mater. Sci. Forum 239, 87 (1997).CrossRefGoogle Scholar
8.Manzini, I., Antonioli, G., Bersani, D., Lottici, P. P., Gnappi, G., and Montenero, A., J. Non-Cryst. Solids 192, 519 (1995).CrossRefGoogle Scholar
9.Warren, B.E., X-ray Diffraction (Addison-Wesley, Reading, MA, 1969), p. 253.Google Scholar
10.Dortmans, L.J.M. G., Morell, R., and de With, G., J. Eur. Ceram. Soc. 12, 205 (1993).CrossRefGoogle Scholar
11.Underwood, E.E., Quantitative Stereology (Addison-Wesley, Reading, MA, 1970).Google Scholar
12.Stearns, L.C. and Harmer, M.P., J. Am. Ceram. Soc. 79, 3013 (1996).CrossRefGoogle Scholar
13.Noyan, I.C. and Cohen, J. B., Residual Stress, Measurements by Diffraction and Interpretation (Springer-Verlag, New York, 1987), p. 119.Google Scholar
14.Yoldas, B.E., Appl. Opt. 21, 2960 (1982).CrossRefGoogle Scholar
15.Yoldas, B. E., J. Sol-Gel Sci. Technol. 1, 65 (1993).CrossRefGoogle Scholar
16.Hess, N.J. and Exarhos, G. J., in Thin Films: Stresses and Mechanical Properties V, edited by Baker, S. P., Børgesen, P., Townsend, P. H., Ross, C. A., and Volkert, C. A. (Mater. Res. Soc. Symp. Proc. 356, Pittsburgh, PA, 1995), p. 597.Google Scholar
17.Ashby, M. F., Cambridge Materials Selector (1993).Google Scholar
18. Anon., Engineered Materials Handbook, Vol. 4, Ceramics and Glasses (ASM INTERNATIONAL, Materials Park, OH, 1991), p. 755.Google Scholar
19.Dreier, G. and Schmauder, S., Scripta Metall. Mater. 28, 103 (1993).CrossRefGoogle Scholar