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Preparation, characterization, and micropatterning of laser-dye-doped sol-gel films

Published online by Cambridge University Press:  31 January 2011

A. Arena ,
S. Patanè ,
G. Saitta ,
G. Rizzo ,
S. Galvagno  and
G. Neri
A. Arena
Affiliation:
Istituto Nazionale per la Fisica della Materia (INFM), Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate, Università di Messina, I-88166 Messina, Italy
S. Patanè
Affiliation:
Istituto Nazionale per la Fisica della Materia (INFM), Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate, Università di Messina, I-88166 Messina, Italy
G. Saitta
Affiliation:
Istituto Nazionale per la Fisica della Materia (INFM), Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate, Università di Messina, I-88166 Messina, Italy
G. Rizzo
Affiliation:
Dipartimento di Chimica Industriale ed Ingegneria dei Materiali, Universitàdi Messina, I-88166 Messina, Italy
S. Galvagno
Affiliation:
Dipartimento di Chimica Industriale ed Ingegneria dei Materiali, Universitàdi Messina, I-88166 Messina, Italy
G. Neri
Affiliation:
Dipartimento di Chimica Industriale ed Ingegneria dei Materiali, Universitàdi Messina, I-88166 Messina, Italy
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Abstract

Planar thin films of dye-doped silica were prepared by sol-gel synthesis. The optical properties of the films were characterized by transmittance measurements in the visible-infrared range and by photoluminescence. Micropatterns whose feature size was on the order of 2.4 μm, were imprinted on the film surface by a simple soft lithography approach. An optical microscope interfaced to a charge-coupled device camera was used to image the imprinted patterns and to analyze the patterned films photoluminescence. A sensitive spectral narrowing of the emission, which occurred only in micropatterned films, was attributed to the lateral confinement of the luminescence due to the micrometer-scale modulation of refractive index produced by the embossing procedure.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 8 , August 2002 , pp. 2095 - 2098
Copyright
Copyright © Materials Research Society 2002

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