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The preparation and electrical properties of TiO2−xFx

Published online by Cambridge University Press:  31 January 2011

Tadashi Endo
Affiliation:
Department of Applied Chemistry, Faculty of Engineering, Tohoku University, Aoba, Sendai, Miyagi 980, Japan
Naoki Morita
Affiliation:
Department of Applied Chemistry, Faculty of Engineering, Tohoku University, Aoba, Sendai, Miyagi 980, Japan
Tsugio Sato
Affiliation:
Department of Applied Chemistry, Faculty of Engineering, Tohoku University, Aoba, Sendai, Miyagi 980, Japan
Masahiko Shimada*
Affiliation:
Department of Applied Chemistry, Faculty of Engineering, Tohoku University, Aoba, Sendai, Miyagi 980, Japan
*
a)The author to whom all correspondence, should be addressed.
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Abstract

The substitution of fluorine for oxygen in TiO2 was investigated by the reaction of Ti2O3, TiO2, and TiF3 under conditions of 4–6.5 GPa and 700–1400°C. The single phase of TiO2−x Fx solid solution was obtained in the region of 0≤x≤0.7. According to the x-ray diffraction data, the a and c axes of the rutile-type structure linearly increased with increasing fluorine content. The electrical resistivities of TiO2−x Fx were in the range from 10 Ω cm for x = 0.3 to 850 Ω cm for x = 0.7 at 300 K and the relationship between In ρ and 1000/T was linear. The activation energies were estimated to be from 0.17 eV at x = 0.3 to 0.28 eV at x = 0.7. Also, the thermoelectric powers at room temperature changed from 250μV/K to + 50 μV/K. The mechanism of electric conduction was discussed on the basis of the extended band model of rutile.

Type
Articles
Copyright
Copyright © Materials Research Society 1988

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