Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-26T02:47:27.006Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanoscale Mechanical Properties of Polymer Composites: Changes in Elastic Modulus and Measurement of Ion Penetration Depth Due to α-radiation

Published online by Cambridge University Press:  31 January 2011

Allen T. Chien ,
Tom Felter ,
James D. LeMay  and
Mehdi Balooch
Allen T. Chien
Affiliation:
Chemistry and Materials Science Directorate, Lawrence Livermore National Laboratory, Livermore, California 94551
Tom Felter
Affiliation:
Chemistry and Materials Science Directorate, Lawrence Livermore National Laboratory, Livermore, California 94551
James D. LeMay
Affiliation:
Chemistry and Materials Science Directorate, Lawrence Livermore National Laboratory, Livermore, California 94551
Mehdi Balooch
Affiliation:
Chemistry and Materials Science Directorate, Lawrence Livermore National Laboratory, Livermore, California 94551
Get access

Abstract

The local mechanical properties of silica-reinforced silicone composites were investigated using a modified atomic force microscopy technique. Elastic modulus measurements (1.5 ± 0.1 MPa) are consistent with bulk measurements (1.9 MPa), and changes in the modulus at the surface of the composite samples (E = 1.5 to 3.5 MPa) were observed as a result of α-irradiation (dose = 1.7 × 1010 to 2.0 × 1012 α/cm2). The sensitivity of the technique was demonstrated by a detectable change in modulus at even the small dose of 1.7 × 1010 α/cm2. The penetration depth of the α-particles into the material, estimated to be 22 ± 2 μm from the sample edge, was determined by cross-section depth profiling; and modeling of the ion penetration depth using transport of ions in matter codes (24.4 ± 0.4 μm) closely matched experimental observations.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 15 , Issue 4 , April 2000 , pp. 838 - 841
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Brown, W.L., Rad. Effects 98, 115 (1986).Google Scholar
2.Lee, E.H., Rao, G.R., Lewis, M.B., and Mansur, L.K., J. Mater. Res. 9, 1043 (1994).Google Scholar
3.Vlassak, J.J. and Nix, W.D., J. Mech. Phys. Solids, 42, 1223 (1994).CrossRefGoogle Scholar
4.Kinney, J.H., Balooch, M., Marshall, S.J., Marshall, G.W. Jr, and Weihs, T.P., Arch. Oral Biol. 41, 9 (1996).CrossRefGoogle Scholar
5.Lucas, B.N., Rosenmayer, C.T., and Oliver, W.C., in Thin Films: Stresses and Mechanical Properties VII, edited by Cammarata, R.C., Nastasi, M., Busso, E.P., and Oliver, W.C. (Mater. Res. Soc. Symp. Proc. 505, Pittsburgh, PA, 1997), p. 97.Google Scholar
6.Syed Asif, S., Wahl, K., and Colton, R., Rev. Sci. Instrum. 70, 2408 (1999).CrossRefGoogle Scholar
7.Fragala, M., Licciardello, A., and Puglisi, O., Nucl. Instrum. Methods Phys. Res., Sect. B 131, 103 (1997).CrossRefGoogle Scholar
8.He, D. and Bassim, M., J. Mater. Sci. 33, 3525 (1998).Google Scholar
9.Evelyn, A., Ila, D., Zimmerman, R., Bhat, K., Poker, D., and Hensley, D., Nucl. Instrum. Methods Phys. Res., Sect. B 127/128, 694 (1997).Google Scholar
10.O'Donnell, J. and Sangster, D., Principles of Radiation Chemistry (Edward Arnold Publishers, London, United Kingdom, 1970).Google Scholar
11.Biersack, J. and Haggmark, L., Nucl. Instrum. Methods Phys. Res., Sect. A 174, 257 (1980).Google Scholar
12.Littmark, U. and Ziegler, J., Handbook of Range Distributions for Energetic Ions in All Elements (Pergamon Press, New York, 1980).Google Scholar
13.Oliver, W. and Pharr, G., J. Mater. Res. 7, 1564 (1992).CrossRefGoogle Scholar
14.DeTeresa, S., Lawrence Livermore National Laboratory (private communication).Google Scholar
15.Evans, D. and Crook, M., MRS Bull. 22(4), 36 (1997).Google Scholar
16.Delides, C. and Shepherd, I., Polymer 18, 97 (1997).Google Scholar
17.Miller, A., J. Am. Chem. Soc. 82, 3519 (1960).CrossRefGoogle Scholar