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Nanoindentation studies of brittle thin films on a titanium alloy substrate

Published online by Cambridge University Press:  31 January 2011

N. Fujisawa ,
M. V. Swain ,
N. L. James ,
R. N. Tarrant ,
J. C. Woodard  and
D. R. McKenzie
N. Fujisawa*
Affiliation:
Biomaterials Science Research Unit, University of Sydney, Suite G11, National Innovation Centre, Australian Technology Park, Eveleigh, NSW 1430, Australia
M. V. Swain
Affiliation:
Biomaterials Science Research Unit, University of Sydney, Suite G11, National Innovation Centre, Australian Technology Park, Eveleigh, NSW 1430, Australia
N. L. James
Affiliation:
VentrAssist Division, MicroMedical Industries Ltd, 126 Greville Street, Chatswood, NSW 2067, Australia
R. N. Tarrant
Affiliation:
Department of Applied and Plasma Physics, School of Physics, University of Sydney, NSW 2006, Australia
J. C. Woodard
Affiliation:
VentrAssist Division, MicroMedical Industries Ltd, 126 Greville Street, Chatswood, NSW 2067,Australia
D. R. McKenzie
Affiliation:
Department of Applied and Plasma Physics, School of Physics, University of Sydney, NSW 2006, Australia
*
a)Address all correspondence to this author.n.fujisawa@staff.usyd.edu.au
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Abstract

The mechanical properties of a range of tribological mitigating and biocompatible films deposited on a titanium alloy substrate have been investigated using nanoindentation. For a range of carbon films investigated, the ratio of hardness to modulus was almost constant at around 0.1. The onset of film–substrate interactions of a coated system upon progressive loading could be determined as the depth of penetration at which the slope of the force versus depth curve deviated from that of an analytically derived “bulk film” system that incorporated the indenter tip effect on the contact area. For the carbon-coated systems investigated, the corresponding force, or the critical load-carrying capacity of a localized contact event by a sharp indenter, appears to scale with the elastic modulus mismatch between film and substrate.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 4 , April 2002 , pp. 861 - 870
Copyright
Copyright © Materials Research Society 2002

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References

1Bell, T.J., Field, J.S., and Swain, M.V., Mater. Forum, 17, 127 (1993).Google Scholar
2Sneddon, I.N., Int. J. Eng. Sci. 3, 47 (1965).CrossRefGoogle Scholar
3Johnson, K.L., Contact Mechanics (Cambridge University Press, Cambridge, United Kingdom, 1985).CrossRefGoogle Scholar
4Doerner, M.F. and Nix, W.D., J. Mater. Res. 1, 601 (1986).CrossRefGoogle Scholar
5King, R.B., Int. J. Solids Struct. 23, 1657 (1987).CrossRefGoogle Scholar
6Oliver, W.C. and Pharr, G.M., J. Mater. Res. 7, 1564 (1992).CrossRefGoogle Scholar
7Bhattacharya, A.K. and Nix, W.D., Int. J. Solids Struct. 24, 1287 (1988).CrossRefGoogle Scholar
8Page, T.F. and Knight, J.C., Surf. Coat. Technol. 39/40, 339 (1989).CrossRefGoogle Scholar
9Fabes, B.D., Oliver, W.C., McKee, R.A., and Walker, F.J., J. Mater. Res. 7, 3056 (1992).CrossRefGoogle Scholar
10Rother, B. and Dietrich, D.A., Phys. Status Solidi 142, 398 (1994).CrossRefGoogle Scholar
11Rother, B. and Dietrich, D.A., Thin Solid Films 250, 181 (1994).CrossRefGoogle Scholar
12Weppelmann, E. and Swain, M.V., Thin Solid Film 286, 111 (1996).CrossRefGoogle Scholar
13Hainsworth, S.V., McGurk, M.R., and Page, T.F., Surf. Coat. Technol. 102, 97 (1998).CrossRefGoogle Scholar
14Hainsworth, S.V., Chandler, H.W., and Page, T.F., J. Mater. Res. 11, 1987 (1996).CrossRefGoogle Scholar
15McGurk, M.R. and Page, T.F., J. Mater. Res. 14, 2283 (1999).CrossRefGoogle Scholar
16Malzbender, J. and With, G. de, Surf. Coat. Technol. 127, 266 (2000).CrossRefGoogle Scholar
17 UMIS Operating Manual (CSIRO Division of Telecommunications & Industrial Physics, Lindfield, Australia, 1997), pp. 6–22, 8-1.Google Scholar
18Malzbender, J., With, G. de, and Toonder, J. den, J. Mater. Res. 15, 1209 (2000).CrossRefGoogle Scholar