Hostname: page-component-848d4c4894-x24gv Total loading time: 0 Render date: 2024-05-06T18:59:19.074Z Has data issue: false hasContentIssue false

A model for the texture development of high-Tc superconductors under an elevated magnetic field

Published online by Cambridge University Press:  31 January 2011

P. J. Ferreira
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
H. B. Liu
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
J. B. Vander Sande
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Get access

Abstract

A theoretical model is proposed to explain the degree of texture achieved in high-Tc superconductors during melt-processing under an elevated magnetic field. The degree of grain alignment is quantified through a factor F which is defined as ranging from 0 (random alignment) to 1 (completely oriented). Intermediate values of F clearly characterize intermediate states of alignment in which there is still some tendency for the grains to align their c axes with the magnetic field. The model suggests that the enhancement in texture is primarily obtained through grain rotation during the early stages of grain growth from the liquid. At the later stages of growth, grains interact with each other, which hinders the phenomena of magnetic-field–induced grain alignment.

Type
Articles
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Johnston, D.C. and Cho, J.H., Phys. Rev. B. 42, 13, 8710 (1990).CrossRefGoogle Scholar
2.Barret, S.E., Durand, D.J., Pennington, C.H., Slitcher, C.P., Friedmann, T.A., Rice, J.P., and Ginsberg, D.M., Phys. Rev. B. 41, 6283 (1990).CrossRefGoogle Scholar
3.Vaknin, D., Sinha, S.K., Stassis, C., Miller, L.L., and Johnston, D.C., Phys. Rev. B. 41, 1926 (1990).CrossRefGoogle Scholar
4.Livingston, J.D. and Hart, H.R. Jr, J. Appl. Phys. 64(10), 5807 (1988).CrossRefGoogle Scholar
5.Farrell, D.E., Chandrasekhar, B.S., DeGuire, M.R., Fang, M.M., Kogan, V.G., Clem, J.R., and Finnemore, D.K., Phys. Rev. B. 36, 4025 (1987).CrossRefGoogle Scholar
6.Ostertag, C.P., Shull, R.D., Vaudin, M.D., Blendell, J.E., Sterns, L.C., and Fuller, E.R. Jr, in Ceramic Superconductors II, edited by Yan, M.F. (The American Ceramic Society, Weaterville, OH, 1988) 332.Google Scholar
7.Chen, F., Zhang, B., Markiewicz, R.S., and Giessen, B.C., Appl. Phys. Lett. 58, 531 (1991).CrossRefGoogle Scholar
8.Holloway, A., McCallum, R.W., and Arrasmith, S.R., J. Mater. Res. 8, 727 (1993).CrossRefGoogle Scholar
9.Sarkar, P. and Nicholson, P.S., Appl. Phys. Lett. 61, 492 (1992).CrossRefGoogle Scholar
10.de Rango, P., Lees, M., Lejay, P., Sulpice, A., Tournier, R., Ingold, M., Germi, P., and Pernet, M., Nature 349, 770 (1991).CrossRefGoogle Scholar
11.Cloots, R., Vandewalle, N., and Ausloos, M., Appl. Phys. Lett. 65, 3386 (1994).CrossRefGoogle Scholar
12.Ma, Y. and Wang, Z., Physica C 282–287 (1997) 2619.CrossRefGoogle Scholar
13.Liu, H.B., Ferreira, P.J., and Vander Sande, J.B., Physica C 303(3–4), 161, (1998).CrossRefGoogle Scholar
14.Liu, H.B., Ferreira, P.J., and Vander Sande, J.B., Physica C (in press).Google Scholar
15.Liu, H.B., Ferreira, P.J., Vander Sande, J.B., and Otto, A., Physica C (in press).Google Scholar
16.Majewski, P., Kaesche, S., and Aldinger, F., Communication T7.7, Materials Research Society Fall Meeting, Boston, MA, 1997 (unpublished).Google Scholar
17.Lotgering, F.K., J. Inorg. Nucl. Chem. 9, 770 (1959).CrossRefGoogle Scholar
18.Poole, C.P. Jr, Datta, T., Farach, H.A., Rigney, M.M., and Sanders, C.R., Copper Oxide Superconductors, (John Wiley, New York, 1988).Google Scholar
19.Nishi, Y., Manabe, T., Watanabe, S., Igarashi, A., and Migaki, K., Journal of Applied Physics 70, 5684 (1991).CrossRefGoogle Scholar
20.Ferreira, P.J. and Vander Sande, J.B. (unpublished).Google Scholar