Hostname: page-component-848d4c4894-hfldf Total loading time: 0 Render date: 2024-06-02T13:37:15.668Z Has data issue: false hasContentIssue false

The micro-impact fracture behavior of lead-free solder ball joints

Published online by Cambridge University Press:  31 January 2011

Y.L. Huang*
Affiliation:
Department of Materials Science and Engineering, National Cheng Kung University, Tainan, Taiwan 70101, Republic of China
K.L. Lin
Affiliation:
Department of Materials Science and Engineering, National Cheng Kung University, Tainan, Taiwan 70101, Republic of China
D.S. Liu
Affiliation:
Department of Mechanical Engineering, National Chung Cheng University, Chia-Yi, Taiwan 621, Republic of China
*
a)Address all correspondence to this author. e-mail: N5894130@mail.ncku.edu.tw
Get access

Abstract

The present study investigated the micro-impact fracture behavior of various lead-free solder joints, including Sn–1Ag–0.1Cu–0.02Ni–0.05In, Sn–1.2Ag–0.5Cu–0.05Ni, and Sn–1Ag–0.5Cu. The fracture that occurs within the solder joint corresponds to a higher impact fracture energy (1.35 mJ), while the fracture at the interface between the solder joint and intermetallic compound acquires a smaller impact energy (0.82 mJ). Two types of fracture mechanisms were proposed based on observations of the fracture morphology and the impact curve for the solder ball joints. The longer deflection distance, referring to better elongation, exists for the mechanism corresponding to the higher fracture energy.

Type
Articles
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Zeng, K.Tu, K.N.: Six cases of reliability study of Pb-free solder joints in electronic packaging technology. Mater Sci. Eng., R 38, 55 2002Google Scholar
2Ho, P.S., Wang, G., Ding, M., Zhao, J.H.Dai, X.: Reliability issues for flip-chip packages. Microelectron. Reliab. 44, 719 2004Google Scholar
3Yoon, J.W., Kim, S.W.Jung, S.B.: Interfacial reaction and mechanical properties of eutectic Sn–0.7Cu/Ni BGA solder joints during isothermal long-term aging. J. Alloys Compd. 391, 82 2005Google Scholar
4Lee, C.Y., Yoon, J.W., Kim, Y.J.Jung, S.B.: Interfacial reactions and joint reliability of Sn–9Zn solder on Cu or electrolytic Au/Ni/Cu BGA substrate. Microelectron. Eng. 82, 561 2005Google Scholar
5Li, M., Lee, K.Y., Olsen, D.R.Chen, W.D.: Microstructure, joint strength and failure mechanisms of SnPb and Pb-Free solders in BGA packages. IEEE Trans. Electron. Packag. 25, 185 2002Google Scholar
6Yoon, J.W., Kim, S.W.Jung, S.B.: IMC morphology, interfacial reaction and joint reliability of Pb-free Sn–Ag–Cu solder on electrolytic Ni BGA substrate. J. Alloys Compd. 392, 247 2005Google Scholar
7Sundelin, J.J., Nurmi, S.T., Lepisto, T.K.Ristolainen, E.O.: Mechanical and microstructural properties of SnAgCu solder joints. Mater. Sci. Eng., A 420, 55 2006CrossRefGoogle Scholar
8Liu, Y.C., Lin, W.H., Lin, H.J.Chuang, T.H.: Intermetallic reactions in Sn-8Zn-20In solder ball grid array packages with Au/Ni/Cu and Ag/Cu pads. J. Electron. Mater. 35, 147 2006Google Scholar
9Liu, C.Q., Conway, P., Li, D.Z.Hendriksen, M.: Analysis of the micro-mechanical properties in aged lead-free, fine pitch flip chip joints. J. Electron. Packag. 126, 359 2004CrossRefGoogle Scholar
10Alam, M.O., Chan, Y.C.Tu, K.N.: Effect of reaction time and P content on mechanical strength of the interface formed between eutectic Sn–Ag solder and Au/electroless Ni (P)/Cu bond pad. J. Appl. Phys. 94, 4108 2003Google Scholar
11Shih, P.C.Lin, K.L.: Interfacial microstructure and shear behavior of Sn-Ag-Cu solder balls joined with Sn-Zn-Bi paste. J. Alloy Compd. 422, 153 2006Google Scholar
12Chuang, T.H., Yen, S.F.Cheng, M.D.: Intermetallic reactions in Sn3Ag0.5Cu and Sn3Ag0.5Cu0.06Ni0.01Ge solder BGA packages with Au/Ni surface finishes. J. Electron. Mater. 35, 302 2006Google Scholar
13Liang, J., Dariavach, N., Barr, G.Fang, Z.: Effects of strain rates and biaxial stress conditions on plastic yielding and flow stress of solder alloys. J. Electron. Mater. 35, 372 2006CrossRefGoogle Scholar
14Ou, S., Xu, Y.Tu, K.N.: Micro-impact test on lead-free BGA balls on Au/electrolytic Ni/Cu bond pad in Proceedings of the 2005 IEEE Electronic Components and Technology Conference (ECTC),467CrossRefGoogle Scholar
15Tsai, K.T., Liu, F.L., Wong, E.H.Rajoo, R.: High strain rate testing of solder interconnections. Soldering Surf. Mount Technol. 18, 12 2006Google Scholar
16Ou, S., Xu, Y., Tu, K.N., Alam, M.O.Chan, Y.C.: A study of impact reliability of lead-free BGA balls on Au/electrolytic Ni/Cu bond pad materials. Technol. Reliab. Adv. Interconnects 863, 381 2005Google Scholar
17Lee, S.W., Newman, K., Sykes, B.Clark, S.: Brittle failure mechanism of SnAgCu and SnPb solder balls during high speed ball shear and cold ball pull tests in Proceedings 57th IEEE Electronic Components and Technology Conference (Reno, NV, 2007),364Google Scholar
18Meyers, M.A.: Dynamic Behavior of Material John Wiley New York 1994Google Scholar