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Low temperature structures of the second stage cesium graphitide and effect of trace impurities

Published online by Cambridge University Press:  31 January 2011

L. Duclaux ,
I. Rannou ,
F. Béguin  and
M. Lelaurain
L. Duclaux
Affiliation:
C.R.M.D., C.N.R.S.-Université, 1B rue de la Férollerie, 45071 Orléans Cedex 02, France
I. Rannou
Affiliation:
C.R.M.D., C.N.R.S.-Université, 1B rue de la Férollerie, 45071 Orléans Cedex 02, France
F. Béguin
Affiliation:
C.R.M.D., C.N.R.S.-Université, 1B rue de la Férollerie, 45071 Orléans Cedex 02, France
M. Lelaurain
Affiliation:
L.C.M.A., Université Nancy I, B.P. 239, 54506 Vandoeuvre lés Nancy, France
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Abstract

Stage 2 CsC24 graphite-cesium derivatives were synthesized and characterized using x-ray diffraction. Pure CsC24 specimens are single phase stage 2 in the range 77–300 K. From the 00l scans, we observed on samples slightly polluted during the transfer in the glove box, the tridimensional segregation of stage 2 in a main CsC26 structure and an additional dense CsC20 structure. The 2D Laue diffraction photographs are the same as already reported, but are interpreted as a mixture of 2 × 2 R 0° lattice commensurate and 2.54 × 2.54 R 14.5° lattice incommensurate structures. In oxidized compounds, we identified another 2.23 × 2.23 R 25.5° 2D additional incommensurate structure corresponding to the composition CsC20 already evidenced by analysis of the 00l diffractograms. We suggest that oxygen impurities are at the origin of this particular stiff and dense structure at low temperature.

Type
Articles
Information
Journal of Materials Research , Volume 11 , Issue 3 , March 1996 , pp. 608 - 617
Copyright
Copyright © Materials Research Society 1996

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References

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