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In situ bulge testing in an atomic force microscope: Microdeformation experiments of thin film membranes

Published online by Cambridge University Press:  31 January 2011

E.W. Schweitzer  and
M. Göken
E.W. Schweitzer*
Affiliation:
University Erlangen–Nürnberg, Department of Materials Science and Engineering, Institute I, D-91058 Erlangen, Germany
M. Göken
Affiliation:
University Erlangen–Nürnberg, Department of Materials Science and Engineering, Institute I, D-91058 Erlangen, Germany
*
a)Address all correspondence to this author. e-mail: elmar.schweitzer@ww.uni-erlangen.de
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Abstract

A new bulge testing setup for the measurement of the mechanical properties of thin films is presented. This self-built device can be incorporated in an atomic force microscope (AFM), which allows the recording of topographic images of the observed sample membranes under load conditions. Bulge test experiments on different silicon nitride films are presented and compared to nanoindentation experiments. The measured elastic moduli from nanoindentation and bulge testing are in good agreement. Apart from that, the ability to extract stress–strain data from AFM scans is shown, and the results are compared to standard bulge testing experiments. Imaging of the sample microstructure under load conditions is demonstrated on a thin Cu film.

Keywords

Thin filmNanoscaleScanning-probe microscopy (SPM)
Type
Articles
Information
Journal of Materials Research , Volume 22 , Issue 10 , October 2007 , pp. 2902 - 2911
Copyright
Copyright © Materials Research Society 2007

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References

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