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Face-centered-cubic titanium: An artifact in titanium/aluminum multilayers

Published online by Cambridge University Press:  31 January 2011

J. Bonevich ,
D. van Heerden  and
D. Josell
J. Bonevich
Affiliation:
National Institute of Standards and Technology, Metallurgy Division, Gaithersburg, Maryland 20899
D. van Heerden
Affiliation:
Department of Materials Science, The Johns Hopkins University, Baltimore, Maryland 21218
D. Josell
Affiliation:
National Institute of Standards and Technology, Metallurgy Division, Gaithersburg, Maryland 20899
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Abstract

The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers. Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 5 , May 1999 , pp. 1977 - 1981
Copyright
Copyright © Materials Research Society 1999

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References

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