Hostname: page-component-7c8c6479df-ws8qp Total loading time: 0 Render date: 2024-03-30T04:02:08.497Z Has data issue: false hasContentIssue false

Effect of sintering temperature and cooling rate on microstructure, phase formation, and critical current density of Ag-sheathed Bi1.8Pb0.4Sr2Ca2Cu3Ox superconducting tapes

Published online by Cambridge University Press:  31 January 2011

J. P. Singh
Affiliation:
Energy Technology Division, Argonne National Laboratory, Argonne, Illinois 60439
N. Vasanthamohan
Affiliation:
Energy Technology Division, Argonne National Laboratory, Argonne, Illinois 60439
Get access

Extract

Silver-sheathed Bi–Pb–Sr–Ca–Cu–O (2223) superconducting tapes (with a starting composition of Bi1.8Pb0.4Sr2Ca1Cu2O8, calcium cuprate, and CuO) were fabricated by the powder-in-tube technique. The tapes were sintered at various temperatures to optimize the formation of Bi1.8Pb0.4Sr2Ca2Cu3O10 phase within the tape. The results show that sintering within the temperature range of 815–825 °C can produce tapes with high critical current density (Jc). The Jc of samples sintered at the higher temperature of 825 °C, where more liquid is present, depended markedly on the rate at which tapes were cooled from the sintering temperature; samples sintered at lower temperatures did not exhibit such a cooling-rate effect. The optimum combination of phase purity and microstructure that yielded an average transport Jc of ≥ 2.5 × 104 A/cm2 was obtained when the tapes were sintered at 825 °C for 150 h and cooled at a rate of 25 °C/h from the sintering temperature. Quenching studies indicate that the Bi-2223 phase becomes unstable below 700 °C during slow cooling. This result may have important implications for processing Bi–Sr–Ca–Cu–O tapes with high Jc. Addition of 15 vol.% Ag flakes to the monolithic core exerted no significant effect on Jc.

Type
Articles
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Sato, K., Shibuta, N., Mukai, H., Hikata, T., Ueyama, M., and Kato, T., J. Appl. Phys. 70, 6484 (1991).CrossRefGoogle Scholar
2.Shimoyama, J., Kase, J., Morimoto, T., Kitaguchi, H., Kumakura, H., Togano, H., and Maeda, H., Jpn. J. Appl. Phys. 31, L1167–L1169 (1992).Google Scholar
3.Parrell, J.A., Dorris, S. E., and Larbalestier, D. C., IEEE Trans. Appl. Supercond. 5, 1275 (1995).CrossRefGoogle Scholar
4.Nomura, S., Fuke, H., Yoshino, H., and Ando, K., Supercond. Sci. Technol. 6, 858862 (1993).Google Scholar
5.Dorris, S. E., Prorok, B. C., Lanagan, M. T., Sinha, S., and Poeppel, R.B., Physica C 212, 66 (1993).CrossRefGoogle Scholar
6.Morgan, P. E.D., Housley, R.M., Porter, J.R., and Ratto, J. R., Physica C 176, 279 (1991).CrossRefGoogle Scholar
7.Luo, J. S., Merchant, N., Escorcia-Aparicio, E., Maroni, V.A., Gruen, D.M., Tani, B. S., Riley, G.N. Jr., and Carter, W. L., IEEE Trans. Appl. Supercond. 3 (1), 972975 (1993).CrossRefGoogle Scholar
8.Carter, W. L., Riley, G.N Jr., Luo, J. S., Merchant, N., and Maroni, V.A., Appl. Supercond. 1 (10–12), 15231534 (1993).CrossRefGoogle Scholar
9.Cullity, B.D., Elements of X-Ray Diffraction, 2nd ed. (Addison-Wesley Pub. Co. Inc., 1978).Google Scholar
10.Joo, J., Singh, J. P., and Poeppel, R.B., Supercond. Sci. Technol. 6, 421428 (1993).CrossRefGoogle Scholar
11.Liu, H.K., Guo, Y. C., and Duo, S.X., Supercond. Sci. Technol. 5, 591598 (1992).CrossRefGoogle Scholar
12.Singh, J. P., Joo, J., Vasanthamohan, N., and Poeppel, R. B., J. Mater. Res. 8, 2458 (1993).CrossRefGoogle Scholar