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Determination of size and distribution of second phases using nuclear microscopy

Published online by Cambridge University Press:  31 January 2011

M.B.H. Breese
Affiliation:
Nuclear Physics Laboratory, Keble Road, Oxford University, Oxford OX1 3RH, United Kingdom
L.T. Romano*
Affiliation:
Materials Department, Parks Road, Oxford University, Oxford OX1 3RH, United Kingdom
C.J. Salter
Affiliation:
Materials Department, Parks Road, Oxford University, Oxford OX1 3RH, United Kingdom
G.W. Grime
Affiliation:
Nuclear Physics Laboratory, Keble Road, Oxford University, Oxford OX1 3RH, United Kingdom
F. Watt
Affiliation:
Nuclear Physics Laboratory, Keble Road, Oxford University, Oxford OX1 3RH, United Kingdom
*
a)Current address: XEROX Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, California 94304.
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Abstract

Nuclear microscopy combines a range of MeV light ion beam analytical techniques such as Proton Induced X-ray Emission (PIXE), Rutherford Backscattering Spectrometry (RBS), and Scanning Transmission Ion Microscopy (STIM). One of the main advantages of using MeV light ion beams for materials characterization is the large analytical volume due to their high penetration depth. This paper shows how nuclear microscopy is used to determine the size and distribution of Pb precipitates in a 40 μm thick alloy sample with a nominal composition of Al–5 wt.% Pb.

Type
Articles
Copyright
Copyright © Materials Research Society 1992

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