Hostname: page-component-8448b6f56d-jr42d Total loading time: 0 Render date: 2024-04-18T18:54:48.083Z Has data issue: false hasContentIssue false
  • English
  • Français

Crystallization Mechanism of Nd1+xBa2−xCu3O7−y and YBa2Cu3O7−y Films Deposited by Metalorganic Deposition Method Using Trifluoroacetates

Published online by Cambridge University Press:  31 January 2011

Junko Shibata ,
Tetsuji Honjo ,
Hiroshi Fuji ,
Takeshi Araki ,
Izumi Hirabayashi ,
Tsukasa Hirayama ,
Teruo Izumi ,
Yuh Shiohara ,
Takahisa Yamamoto  and
Yuichi Ikuhara
Junko Shibata
Affiliation:
Engineering Research Institute, School of Engineering, The University of Tokyo, 2–11–16 Yayoi, Bunkyo-ku, Tokyo 113–8656, Japan
Tetsuji Honjo
Affiliation:
Superconductivity Research Laboratory, ISTEC, 1–11–13 Shinonome, Koto-ku, Tokyo 135–0062, Japan
Hiroshi Fuji
Affiliation:
Superconductivity Research Laboratory, ISTEC, 1–11–13 Shinonome, Koto-ku, Tokyo 135–0062, Japan
Takeshi Araki
Affiliation:
Superconductivity Research Laboratory, ISTEC, 2–4-1 Mutsuno, Atsuta-ku, Nagoya 456–8587, Japan
Izumi Hirabayashi
Affiliation:
Superconductivity Research Laboratory, ISTEC, 2–4-1 Mutsuno, Atsuta-ku, Nagoya 456–8587, Japan
Tsukasa Hirayama
Affiliation:
Japan Fine Ceramics Center, 2–4-1 Mutsuno, Atsuta-ku, Nagoya 456–8587, Japan
Teruo Izumi
Affiliation:
Superconductivity Research Laboratory, ISTEC, 1–11–13 Shinonome, Koto-ku, Tokyo 135–0062, Japan
Yuh Shiohara
Affiliation:
Superconductivity Research Laboratory, ISTEC, 1–11–13 Shinonome, Koto-ku, Tokyo 135–0062, Japan
Takahisa Yamamoto
Affiliation:
Engineering Research Institute, School of Engineering, The University of Tokyo, 2–11–16 Yayoi, Bunkyo-ku, Tokyo 113–8656, Japan
Yuichi Ikuhara
Affiliation:
Engineering Research Institute, School of Engineering, The University of Tokyo, 2–11–16 Yayoi, Bunkyo-ku, Tokyo 113–8656, Japan
Get access

Abstract

YBa2Cu3O7−y(Y123) and Nd1+xBa2−xCu3O7−y (Nd123) films were deposited by the metalorganic deposition method, and the growth mechanism of these films was investigated by high-resolution transmission electron microscopy and energy dispersive x-ray spectroscopy. The Y123 and Nd123 films were prepared by spin-coating LaAlO3 (001) and SrTiO3 (STO) (001) substrates, respectively, with solutions including trifluoroacetates. Then, the samples were heat treated at 673 K in a humid O2 gas flow to form amorphous precursor films. Finally, the precursor films were heated at higher temperatures for 0–30 min in a humid Ar/O2 gas flow and cooled rapidly from those annealing temperatures. It was found that CuO crystals with a size of 10–20 nm are segregated in the Y123 and Nd123 amorphous precursor films. In the Y123 quenched film prepared by cooling the precursor film rapidly after the heat-treatment at 1048 K for 30 min, a polycrystalline film including Y2Cu2O5, BaF2, and CuO crystals was found to be generated on the c-axis-oriented Y123 film. In contrast, in the Nd123 quenched films, (NdBa)2CuO4(Nd201) phase was found to be formed first on the surface of the STO substrate. In conclusion, the c-axis-oriented Y123 film is formed by diffusion and reaction of Y2Cu2O5, BaF2, and CuO crystals, and the Nd201 phase reacts with BaF2 and CuO crystals in a humid atmosphere to form a c-axis-oriented Nd123 film.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 6 , June 2002 , pp. 1266 - 1275
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Gupta, A., Koren, G., Giess, E.A., Moore, N.R., Q’Sullivan, E.J.M., and Cooper, E.I., Appl. Phys. Lett. 52, 163 (1988).CrossRefGoogle Scholar
2.Kawai, M., Kawai, T., Masuhira, H., and Takahashi, M., Jpn. J. Appl. Phys. 26, L1740 (1987).Google Scholar
3.Hamdi, A.H., Mantese, J.V., Micheli, A.L., Laugal, R.C.O., Dungan, D.F., Zhang, Z.H., and Padmanabhan, K.R., Appl. Phys. Lett. 51, 2152 (1987).Google Scholar
4.Rice, C.E., van Dover, R.B., and Fisanick, G.J., Appl. Phys. Lett. 51, 1842 (1987).CrossRefGoogle Scholar
5.Gross, M.E., Hong, M., Liou, S.H., Gallagher, P.K., and Kwo, J., Appl. Phys. Lett. 52, 160 (1988).Google Scholar
6.Manabe, T., Kondo, W., Mizuta, S., and Kumagai, T., Jpn. J. Appl. Phys. 30, L1641 (1991).CrossRefGoogle Scholar
7.Manabe, T., Yamaguchi, I., Nakamura, S., Kondo, W., Kumagai, T., and Mizuta, S., J. Mater. Res. 10, 1635 (1995).Google Scholar
8.Yamagiwa, K. and Hirabayashi, I., Physica C. 304, 12 (1998).CrossRefGoogle Scholar
9.Parmigiani, F., Chiarello, G., Ripamonti, N., Goretzki, H., and Roll, U., Phys. Rev. B. 36, 7148 (1987).CrossRefGoogle Scholar
10.Gupta, A., Jagannathan, R., Cooper, E.I., Giess, E.A., Landman, J.I., and Hussey, B.W., Appl. Phys. Lett. 52, 2077 (1988).CrossRefGoogle Scholar
11.McIntyre, P.C., Cima, M.J., and Ng, M.F., J. Appl. Phys. 68, 4183 (1990).CrossRefGoogle Scholar
12.McIntyre, P.C., Cima, M.J., Smith, J.A. Jr., Hallock, R.B., Siegal, M.P., and Phillips, J.M., J. Appl. Phys. 71, 1868 (1992).CrossRefGoogle Scholar
13.McIntyre, P.C. and Cima, M.J., J. Mater. Res. 9, 2219 (1994).Google Scholar
14.McIntyre, P.C., Cima, M.J., and Roshko, A., J. Appl. Phys. 77, 5263 (1995).CrossRefGoogle Scholar
15.McIntyre, P.C., Cima, M.J., and Roshko, A., J. Cryst. Growth. 149, 64 (1995).CrossRefGoogle Scholar
16.Smith, J.A., Cima, M.J., and Sonnenberg, N., IEEE Trans. Appl. Supercond. 9, 1531 (1999).CrossRefGoogle Scholar
17.Araki, T., Takahashi, Y., Yamagiwa, K., Iijima, Y., Takeda, K., Yamada, Y., Shibata, J., Hirayama, T., and Hirabayashi, I., Physica C 357–360, 991 (2001).CrossRefGoogle Scholar
18.Fuji, H., Honjo, T., Nakamura, Y., Izumi, T., Araki, T., Hirabayashi, I., Shiohara, Y., Iijima, Y., and Takeda, K., Physica C 357–360, 1011 (2001).CrossRefGoogle Scholar
19.Wu, L., Zhu, Y., Solovyov, V.F., Wiesmann, H.J., Moodenbaugh, A.R., Sabatini, R.L., and Suenaga, M., J. Mater. Res. 16, 2869 (2001).CrossRefGoogle Scholar
20.Honjo, T., Fuji, H., Huang, D., Nakamura, Y., Izumi, T., and Shiohara, Y., in High-Temperature Superconductors—Crystal Chemistry Processing and Properties, edited by Balachardran, U. (Balu), Freyhardt, H.C., Izumi, T., and Larbalestier, D.C., (Mater. Res. Symp. Proc. 659, Warrendale, PA, 2001), p. II 4.2.Google Scholar
21.Shibata, J., Yamagiwa, K., Hirabayashi, I., and Hirayama, T., Jpn. J. Appl. Phys. 37, L1141 (1998).Google Scholar
22.Shibata, J., Yamagiwa, K., Hirabayashi, I., Ma, Xiuliang, Yuan, J., Hirayama, T., and Ikuhara, Y., Jpn. J. Appl. Phys. 38, 5050 (1999).CrossRefGoogle Scholar
23.Yoshizumi, M., Doctoral Thesis, The University of Tokyo, Tokyo, Japan (2001).Google Scholar
24. JCPDS Powder Diffraction File, No. 38-342 (International Center for Diffraction Data).Google Scholar