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TEM studies of dislocations in deformed melt-textured YBa2Cu3Ox superconductors

Published online by Cambridge University Press:  03 March 2011

M. Mironova
Affiliation:
Department of Mechanical Engineering and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-4792
V. Selvamanickam
Affiliation:
Department of Mechanical Engineering and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-4792
D.F. Lee
Affiliation:
Department of Mechanical Engineering and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-4792
K. Salama
Affiliation:
Department of Mechanical Engineering and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-4792
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Abstract

TEM studies have been conducted on melt-textured YBa2Cu3Ox samples that were uniaxially and isostatically deformed at high temperatures and compared with those of undeformed samples. Dislocation pile-ups along [100] and [010] are found to be the common feature between undeformed samples with the best Jc and the uniaxially deformed samples, and are suggested to be responsible for enhanced pinning when the magnetic field (H) is applied parallel to the a-b plane. Dislocation loops, tangles, and arrays are also observed, and are considered to contribute to pinning in field orientations other than Ha-b. In addition to these dislocations, 〈301〉 type partial dislocations are found to be present in isostatically deformed samples. The strain field around these dislocations is considered to be an additional source of pinning in the intermediate field orientations.

Type
Articles
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1Mannhart, J., Anselmetti, D., Bednorz, J. G., Gerber, Ch., Müller, K. A., and Schlom, D. G., Proc. 6th Int. Workshop on Crit. Currents in High-Tc Supercond., Cambridge, U.K. (1991), p. 5242.Google Scholar
2Zheng, X., Kuriyaki, H., Hirakawa, K., Tanaka, E., and Tomokiyo, Y., Jpn. J. Appl. Phys. 31, L1236 (1992).CrossRefGoogle Scholar
3Zhu, Y. and Suenaga, M., Philos. Mag. 66, 457 (1992).CrossRefGoogle Scholar
4Shi, D., Goretta, K. C., Chen, J. G., and Salem-Sugui, S. Jr., Proc. 1991 TMS Annu. Meeting, New Orleans, LA (1991).Google Scholar
5Mironova, M., Lee, D. F., and Salama, K., Physica C 211, 188 (1993).CrossRefGoogle Scholar
6Pant, V. M., Strechnikov, V. L., Solovjov, V. F., Taborov, V. F., Zandbergen, H. W., and Won, J. G., Supercond. Sci. Technol. 5, 707 (1992).Google Scholar
7Zhou, L., in High Temperature Superconductivity (BHTSC'92), edited by Zhao, Z. X., Gan, Z. Z., and Han, R. S. (World Scientific Publishing Co., Singapore, 1992).Google Scholar
8Selvamanickam, V., Mironova, M., and Salama, K., J. Mater. Res. 8, 249 (1993).CrossRefGoogle Scholar
9Selvamanickam, V., Mironova, M., Son, S., and Salama, K., Physica C 208, 238 (1993).CrossRefGoogle Scholar
10Selvamanickam, V., Partsinevelos, C., McGuire, A. V., and Salama, K., Appl. Phys. Lett. 60, 3313 (1992).CrossRefGoogle Scholar
11Steeds, J. W. and Willis, J. R., in Dislocations in Solids, edited by Nabarro, F. R. N. (North-Holland Publishing Co., New York, 1979), Vol. 1, Chap. 2.Google Scholar
12Kes, P. H., Physica C 185–189, 288 (1991).CrossRefGoogle Scholar
13Shi, D., Chen, J. G., Xu, M., McGinn, P. J., Chen, W. H., and Goretta, K. C., IEEE Trans. Magn. 27, 1080 (1991).CrossRefGoogle Scholar
14Kramer, M. J., Chumbley, L. S., McCallum, R. W., Mellis, W. J., Weir, S., and Kvam, E. P., Physica C 166, 115 (1990).CrossRefGoogle Scholar
15Yoshida, T., Kuroda, K., and Saka, H., Philos. Mag. A 62, 573 (1990).CrossRefGoogle Scholar
16Campbell, A. M. and Evetts, J. E., Adv. Phys. 21, 199 (1972).CrossRefGoogle Scholar