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Preparation and Improvement in the Electrical Properties of Lead-zinc-niobate–based Ceramics by Thermal Treatments

Published online by Cambridge University Press:  31 January 2011

Huiqing Fan
Affiliation:
School of Materials Science & Engineering, Seoul National University, Seoul, 151–742, Korea
Gun-Tae Park
Affiliation:
School of Materials Science & Engineering, Seoul National University, Seoul, 151–742, Korea
Jong-Jin Choi
Affiliation:
School of Materials Science & Engineering, Seoul National University, Seoul, 151–742, Korea
Jungho Ryu
Affiliation:
School of Materials Science & Engineering, Seoul National University, Seoul, 151–742, Korea
Hyoun-Ee Kim
Affiliation:
School of Materials Science & Engineering, Seoul National University, Seoul, 151–742, Korea
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Abstract

The piezoelectric and dielectric properties of Pb(Zn1/3Nb2/3)O3 (PZN)-based ceramics were investigated. The perovskite structure of PZN ceramics was stabilized by the addition of Pb(Zn0.47Ti0.53)O3 (PZT). The highest piezoelectric properties were observed for the composition of 0.5PZN–0.5PZT, which lies on the two-phase zone of morphotropic phase boundary. For further improvements in electric properties, the specimens were thermally treated in a flowing O2 atmosphere at temperatures ranging from 860 to 1030 °C. The thermal treatment eliminated the PbO-rich amorphous intergranular layer by lead evaporation. As a result of this improvement in structure, the dielectric constant (ε′), the piezoelectric coefficient (d33), and the electromechanical coupling factor (kp), were enhanced markedly after thermal annealing at 960 °C for 8 h in an O2 atmosphere.

Type
Articles
Copyright
Copyright © Materials Research Society 2002

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References

Cross, L.E., Ferroelectrics 76, 241 (1987).Google Scholar
Yamashita, Y., Am. Ceram. Soc. Bull. 74, 106 (1995).Google Scholar
Park, S-E. and Shrout, T.R., J. Appl. Phys. 82, 1804 (1997).CrossRefGoogle Scholar
Liu, S-F., Park, S-E., Shrout, T.R., and Cross, L.E., J. Appl. Phys. 85, 2810 (1999).CrossRefGoogle Scholar
Barad, Y., Lu, Y., Cheng, Z-Y., Park, S-E., and Zhang, Q.M., Appl. Phys. Lett. 77, 1247 (2000).CrossRefGoogle Scholar
Furukawa, O., Yamashita, Y., and Harata, M., Jpn. J. Appl. Phys. (Suppl.) 24, 96 (1985).Google Scholar
Halliyal, A., Kumar, U., Newnham, R., and Cross, L.E., Am. Ceram. Soc. Bull. 66, 671 (1987).Google Scholar
Halliyal, A. and Safari, A., Ferroelectrics 158, 295 (1994).Google Scholar
IEEE Standard on Piezoelectricity, IEEE Standard 176-1978, (IEEE, New York, 1978).Google Scholar
Jaffe, B., Cook, W.R. Jr., and Jaffe, H., Piezoelectric Ceramics (Academic Press, New York, 1971).Google Scholar
Shrout, T.R. and Swartz, S.L., Mater. Res. Bull. 18, 663 (1983).CrossRefGoogle Scholar
Guha, J.P., J. Mater. Sci. 34, 4985 (1999).CrossRefGoogle Scholar
Lucas, P. and Petuskey, W.T., J. Am. Ceram. Soc. 84, 2150 (2001).CrossRefGoogle Scholar
Jang, H.M., Oh, S.H., and Moon, J.H., J. Am. Ceram. Soc. 75, 82 (1992).CrossRefGoogle Scholar