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The kinetics of indium/amorphous-selenium multilayer thin film reactions

Published online by Cambridge University Press:  31 January 2011

K. Lu
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706
M. L. Sui
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706
J. H. Perepezko
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706
B. Lanning
Affiliation:
Lockheed Martin Aerospace, Littleton, Colorado 80127
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Abstract

The reaction kinetics in vapor-deposited indium/amorphous-selenium (a-Se) multilayer thin films were studied using differential scanning calorimetry (DSC), x-ray diffraction (XRD), and transmission electron microscopy (TEM). A number of reactions were observed upon heating with characteristic temperatures which were found to be independent of the multilayer modulation wavelength. The initial interface reaction between In and a-Se is the formation of an In2Se phase. Kinetic analyses of the In2Se formation process combined with TEM observations indicated that interface reaction is characterized by the two-dimensional growth of pre-existing In2Se regions formed during deposition to impingement in the plane of the original In/a-Se interface. The change of the density of In2Se grains with temperature was analyzed in terms of the derived kinetic parameters, which is consistent with TEM observations and the heat release measurements.

Type
Articles
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1.Hedstrom, J., Ohlsen, H., Bodegard, M., Kylner, A., Stolt, L., Hariskos, D., Ruckn, M., and Schock, H.W., Proc. 23rd IEEE PVSC (1993), p. 364.Google Scholar
2.Rockett, A. and Birkmire, R. W., J. Appl. Phys. 70, R81 (1991).CrossRefGoogle Scholar
3.Klenk, R., Walter, T., Schock, H-W., and Cahen, D., Adv. Mater. 5, 114 (1993).CrossRefGoogle Scholar
4.Schock, H-W., MRS Bull. 18, 43 (1993).CrossRefGoogle Scholar
5.Schock, H-W., in Advances in Solid State Physics, edited by Helbig, R. (Vieweg, Braunschweig, 1995), Vol. 34, p. 147.Google Scholar
6.Coffey, K.R., Clevenger, L. A., Barmark, K., Rudman, D.A., and Thompson, C.V., Appl. Phys. Lett. 55, 852 (1989).CrossRefGoogle Scholar
7.Clevenger, L.A. and Thompson, C. V., J. Appl. Phys. 67, 1325 (1990).CrossRefGoogle Scholar
8.Ma, E., Thompson, C.V., and Clevenger, L. A., J. Appl. Phys. 69, 2211 (1991).CrossRefGoogle Scholar
9.Lu, K., Perepezko, J. H., Lindahl, K.A., and Lanning, B., Philos. Mag. Lett. 76, 299 (1997).CrossRefGoogle Scholar
10.Binary Alloy Phase Diagrams, edited by Massalski, T.B., Okamoto, H., Subramanian, P.R., and Kacprzak, L. (ASM INTERNATIONAL, Materials Park, OH, 1990), Vol. 3, p. 2290.Google Scholar
11.Hogg, J. H. C., Sutherland, H. H., and Williams, D. J., Acta Crystallogr. B29, 1590 (1973).CrossRefGoogle Scholar
12.Man, L.I. and Samiletov, S. A., Sov. Phys.-Crystallography 10, 328 (1965).Google Scholar
13.Shunk, F. A., Constitution of Binary Alloys, 2nd Suppl. (McGraw-Hill Book Co., New York, 1969), pp. 450451.Google Scholar
14. The XRD diffraction pattern for In2Se was obtained from calculations according to the lattice structure and space group information reported in Ref. 12.Google Scholar
15.Lu, K., Sui, M. L., Perepezko, J.H., and Lanning, B., unpublished.Google Scholar
16.Kuehn, G. and Boehnke, U., J. Cryst. Growth 61, 415 (1983).CrossRefGoogle Scholar
17.Sui, M. L. and Perepezko, J. H. (to be published).Google Scholar
18.Avrami, M., J. Chem. Phys. 7, 1103 (1939); 8, 212 (1940); 9, 177 (1941).CrossRefGoogle Scholar
19.Christian, J. W., The Theory of Transformation in Metals and Alloys (Pergamon, Oxford, 1975).Google Scholar
20.Kissinger, H.E., Anal. Chem. 29, 1702 (1975).CrossRefGoogle Scholar
21.Ma, E., Clevenger, L. A., and Thompson, C. V., J. Mater. Res. 7, 1350 (1992).CrossRefGoogle Scholar
22.Abrikosov, N.Kh. and Chizhevskaya, S. N., Inorg. Mater. (USSR) 7, 1162 (1971).Google Scholar
23.Poltavtsev, Yu. G. and Sheremet, G. P., Russian J. Phys. Chem. 54, 65 (1980).Google Scholar
24.Koster, U. and Schunemann, U., in Rapidly Solidified Alloys, edited by Liebermann, H.H. (Marcel Dekker, Inc., New York, 1993), p. 303.Google Scholar