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Experimental determination of the effective indenter shape and ε-factor for nanoindentation by continuously measuring the unloading stiffness

Published online by Cambridge University Press:  31 August 2011

Benoit Merle*
Affiliation:
Institute I: General Materials Properties, Department of Materials Science and Engineering, Friedrich-Alexander-University Erlangen-Nürnberg, 91058 Erlangen, Germany
Verena Maier
Affiliation:
Institute I: General Materials Properties, Department of Materials Science and Engineering, Friedrich-Alexander-University Erlangen-Nürnberg, 91058 Erlangen, Germany
Mathias Göken
Affiliation:
Institute I: General Materials Properties, Department of Materials Science and Engineering, Friedrich-Alexander-University Erlangen-Nürnberg, 91058 Erlangen, Germany
Karsten Durst
Affiliation:
Institute I: General Materials Properties, Department of Materials Science and Engineering, Friedrich-Alexander-University Erlangen-Nürnberg, 91058 Erlangen, Germany
*
a)Address all correspondence to this author. e-mail: benoit.merle@ww.uni-erlangen.de
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Abstract

The Oliver and Pharr method for evaluating nanoindentation load–displacement data is based on the measurement of the contact stiffness, which is usually determined at the very beginning of the unloading sequence, or, using dynamic nanoindentation, continuously during the whole loading segment. A new experimental method has been developed to continuously monitor the contact stiffness throughout the unloading sequence. It provides supplementary information about the shape and area of the residual impression, as well as a direct measurement of the shape of the effective indenter previously introduced by Pharr and Bolshakov. The new method was applied to indentations on fused silica, sapphire, nanocrystalline nickel, and ultrafine-grained aluminum. Lastly, the new procedure was adapted to directly measure the epsilon factor used in the Oliver and Pharr method. A value of 0.76 was found from indentation into fused silica, in close agreement with literature values.

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Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1.Oliver, W.C. and Pharr, G.M.: Improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564 (1992).CrossRefGoogle Scholar
2.Oliver, W.C. and Pharr, G.M.: Measurement of hardness and elastic modulus by instrumented indentation: Advances in understanding and refinements to methodology. J. Mater. Res. 19, 3 (2004).CrossRefGoogle Scholar
3.Sneddon, I.N.: The relation between load and penetration in the axisymmetric boussinesq problem for a punch of arbitrary profile. Int. J. Eng. Sci. 3, 47 (1965).Google Scholar
4.Bolshakov, A., Oliver, W.C., and Pharr, G.M.: Explanation for the shape of nanoindentation unloading curves based on finite element simulation, in Thin Films: Stresses and Mechanical Properties V, edited by Baker, S.P., Ross, C.A., Townsend, P.H., Volkert, C.A., and Børgesen, P. (Mater. Res. Soc. Symp. Proc. 356, Pittsburgh, PA, 1995), p. 675.Google Scholar
5.Pharr, G.M. and Bolshakov, A.: Understanding nanoindentation unloading curves. J. Mater. Res. 17, 2660 (2002).CrossRefGoogle Scholar
6.Woirgard, J. and Dargenton, J-C.: An alternative method for penetration depth determination in nanoindentation measurements. J. Mater. Res. 12, 2455 (1997).Google Scholar
7.Schwarzer, N.: Elastic surface deformation due to indenters with arbitrary symmetry of revolution. J. Phys. D: Appl. Phys. 37, 2761 (2004).CrossRefGoogle Scholar
8.Schwarzer, N.: Analysing nanoindentation unloading curves using Pharr’s concept of the effective indenter shape. Thin Solid Films 494, 168 (2006).CrossRefGoogle Scholar
9.Herrmann, M. and Richter, F.: Determination of Young’s modulus of thin films using the concept of the effective indenter. Philos. Mag. 91, 1356 (2011).CrossRefGoogle Scholar
10.Larsson, P-L., Giannakopoulos, A.E., Söderlund, E., Rowcliffe, D.J., and Vestergaard, R.: Analysis of the Berkovich indentation. Int. J. Solids Struct. 33, 221 (1996).CrossRefGoogle Scholar
11.Malzbender, J., De With, G., and Den Toonder, J.: The P-h2 relationship in indentation. J. Mater. Res. 15, 1209 (2000).CrossRefGoogle Scholar
12.Cheng, Y-T. and Cheng, C-M.: Scaling relationships in indentation of power-law creep solids using self-similar indenters. Philos. Mag. Lett. 81, 9 (2001).CrossRefGoogle Scholar
13.Backes, B., Durst, K., and Göken, M.: Determination of plastic properties of polycrystalline metallic materials by nanoindentation: Experiments and finite element simulations. Philos. Mag. 86, 5541 (2006).CrossRefGoogle Scholar
14.Hay, J.L., Agee, P., and Herbert, E.G.: Continuous stiffness measurement during instrumented indentation testing. Exp. Tech. 34, 86 (2010).CrossRefGoogle Scholar
15.Pharr, G.M., Oliver, W.C., and Brotzen, F.R.: On the generality of the relationship among contact stiffness, contact area, and elastic modulus during indentation. J. Mater. Res. 7, 613 (1992).CrossRefGoogle Scholar
16.Hay, J.C., Bolshakov, A., and Pharr, G.M.: Critical examination of the fundamental relations used in the analysis of nanoindentation data. J. Mater. Res. 14, 2296 (1999).CrossRefGoogle Scholar
17.Chudoba, T. and Jennett, N.M.: Higher accuracy analysis of instrumented indentation data obtained with pointed indenters. J. Phys. D: Appl. Phys. 41, 215407 (2008).CrossRefGoogle Scholar
18.Pharr, G.M., Strader, J., and Oliver, W.C.: Critical issues in making small-depth mechanical property measurements by nanoindentation with continuous stiffness measurement. J. Mater. Res. 24, 653 (2009).CrossRefGoogle Scholar
19.Natter, H. and Hempelmann, R.: Tailor-made nanomaterials designed by electrochemical methods. Electrochim. Acta 49, 51 (2003).CrossRefGoogle Scholar
20.Li, Y.J., Mueller, J., Höppel, H.W., Göken, M., and Blum, W.: Deformation kinetics of nanocrystalline nickel. Acta Mater. 55, 5708 (2007).CrossRefGoogle Scholar
21.Mueller, J., Durst, K., Amberger, D., and Göken, M.: Local investigations of the mechanical properties of ufg metals by nanoindentation. Mater. Sci. Forum 503504, 31 (2006).CrossRefGoogle Scholar
22.Maier, V., Durst, K., Mueller, J., Backes, B., Höppel, H.W., and Göken, M.: Nanoindentation strain-rate jump tests for determining the local strain-rate sensitivity in nanocrystalline Ni and ultrafine-grained Al. J. Mater. Res. 26(11), 1421 (2011).CrossRefGoogle Scholar
23.Höppel, H.W., May, J., and Göken, M.: Enhanced strength and ductility in ultrafine grained aluminium produced by ARB. Adv. Eng. Mater. 6, 781 (2004).CrossRefGoogle Scholar
24.Böhner, A., Maier, V., Durst, K., Höppel, H.W., and Göken, M.: Macro- and nanomechanical properties and strain-rate sensitivity of accumulative roll bonded and equal channel angular pressed ultrafine-grained materials. Adv. Eng. Mater. 13, 251 (2011).CrossRefGoogle Scholar
25.Bolshakov, A. and Pharr, G.M.: Influences of pileup on the measurement of mechanical properties by load and depth-sensing indentation techniques. J. Mater. Res. 13, 1049 (1999).Google Scholar
26.Fischer-Cripps, A.C.: Illustrative analysis of load-displacement curves in nanoindentation. J. Mater. Res. 22, 3075 (2007).CrossRefGoogle Scholar
27.Cheng, Y-T. and Cheng, C-M.: Relationships between initial unloading slope, contact depth, and mechanical properties for conical indentation in linear viscoelastic solids. J. Mater. Res. 20, 1046 (2005).CrossRefGoogle Scholar