Skip to main content Accessibility help
×
Home
Hostname: page-component-768ffcd9cc-5rkl9 Total loading time: 0.346 Render date: 2022-12-04T15:39:38.355Z Has data issue: true Feature Flags: { "useRatesEcommerce": false } hasContentIssue true

Effects of residual (or internal) stress on ferroelectric domain wall motion in tetragonal lead titanate

Published online by Cambridge University Press:  31 January 2011

Wonyoung Chang
Affiliation:
Battery Research Center, Korea Institute of Science and Technology, Seongbuk-gu, Seoul 136-791, Korea
Alexander H. King
Affiliation:
Ames Laboratory, Ames, Iowa 50011
Keith J. Bowman*
Affiliation:
Purdue University, West Lafayette, Indiana 47907
*
a) Address all correspondence to this author. e-mail: kbowman@ecn.purdue.edu
Get access

Abstract

The effect of temperature on grinding-induced texture in tetragonal lead titanate (PT) has been investigated as a function of the magnitude of loading applied to the sample surface during grinding, using in situ x-ray diffraction (XRD) with an area detector. Compared to the ground PT under lower loading conditions (5 N), the ground PT under higher loading conditions (40 N) retains strong ferroelastic texture near the Curie temperature (TC) around 350 °C and undergoes smaller changes in lattice parameter or tetragonality versus temperature during in situ thermal cycling between room temperature and approximately 100 °C above the TC. Inhibited depoling of ground PT materials investigated by in situ texture measurements demonstrates the effects of residual stresses.

Type
Articles
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Chang, W., King, A.H., and Bowman, K.J.: Thermal effects on mechanical grinding-induced surface texture in tetragonal piezo-electrics. J. Mater. Res. 22(10), 2845 (2007).CrossRefGoogle Scholar
2.Cheng, S., Lloyd, I.K., and Kahn, M.: Modification of surface texture by grinding and polishing lead zirconate titanate ceramics. J. Am. Cerarti. Soc. 75(8), 2293 (1992).CrossRefGoogle Scholar
3.Johnson-Walls, D., Evans, A.G., Marshall, D.B., and James, M.R.: Residual stresses in machined ceramic surfaces. J. Am. Ceram. Soc. 69(1), 44 (1986).CrossRefGoogle Scholar
4.Hammer, M., Monty, C., Endriss, A., and Hoffmann, M.J.: Correlation between surface texture and chemical composition in un-doped, hard, and soft piezoelectric PZT ceramics. J. Am. Ceram. Soc. 81(3), 721 (1998).CrossRefGoogle Scholar
5.Eigenmann, B. and Macherauch, E.: Determination of inhomoge-neous residual stress states in surface layers of machined engineering ceramics by synchrotron x-rays. Nucl. Instrum. Methods Phys. Res., Sect. B 97, 92 (1995).CrossRefGoogle Scholar
6.Behnken, H. and Hauk, V.: Determination of steep stress gradients by x-ray diffraction-Results of a joint investigation. Mater. Sci. Eng., A 300, 41 (2000).CrossRefGoogle Scholar
7.Yu, S.Y., Han, X.S., and Lin, B.: A study on surface quality of ultraprecision grinding for engineering ceramics. Key Eng. Mater. 202–203, 35 (2001).CrossRefGoogle Scholar
8.Li, C.C., Zhang, X.W., and Xia, Y.J.: The measurement of space distribution of domains in polarized PZT ceramics. Ferroelectrics 37, 623 (1981).Google Scholar
9.Chang, W., King, A.H., and Bowman, K.J.: Thermal effects on domain orientation of tetragonal piezoelectrics studied by in situ x-ray diffraction. Appl. Phys. Lett. 88, 242901 (2006).CrossRefGoogle Scholar
10.Jones, J.L., Iverson, B.J., and Bowman, K.J.: Texture and anisotropy of polycrystalline piezoelectrics. J. Am. Ceram. Soc. 90(8), 2297 (2007).CrossRefGoogle Scholar
11.Anton, E-M., García, R.E., Key, T.S., Blendell, J.E., and Bowman, K.J.: Domain switching mechanisms in polycrystalline ferroelectrics with asymmetric hysteretic behavior. J. Appl. Phys. 105, 024107 (2009).CrossRefGoogle Scholar
12.Kounga Njiwa, A.B., Aulbach, E., Granzow, T., and Rödel, J.: Influence of radial stress on the poling behaviour of lead zirconate titanate ceramics. Acta Mater. 55, 675 (2007).CrossRefGoogle Scholar

Save article to Kindle

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Effects of residual (or internal) stress on ferroelectric domain wall motion in tetragonal lead titanate
Available formats
×

Save article to Dropbox

To save this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about saving content to Dropbox.

Effects of residual (or internal) stress on ferroelectric domain wall motion in tetragonal lead titanate
Available formats
×

Save article to Google Drive

To save this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about saving content to Google Drive.

Effects of residual (or internal) stress on ferroelectric domain wall motion in tetragonal lead titanate
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *