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Correlation between the trap state spectra and dielectric behavior of CaCu3Ti4O12

Published online by Cambridge University Press:  14 January 2011

K. Bärner ,
X.J. Luo ,
X.P. Song ,
C. Hang ,
S.S. Chen ,
I.V. Medvedeva  and
C.P. Yang
K. Bärner
Affiliation:
Department of Physics, University Göttingen, 1-37077 Göttingen, Germany
X.J. Luo
Affiliation:
Faculty of Physics & Electronic Technology, Hubei University, Wuhan 430062, People’s Republic of China
X.P. Song
Affiliation:
Faculty of Physics & Electronic Technology, Hubei University, Wuhan 430062, People’s Republic of China
C. Hang
Affiliation:
Faculty of Physics & Electronic Technology, Hubei University, Wuhan 430062, People’s Republic of China
S.S. Chen
Affiliation:
Faculty of Physics & Electronic Technology, Hubei University, Wuhan 430062, People’s Republic of China
I.V. Medvedeva
Affiliation:
Institute of Metal Physics, Ural Division of the Russian Academy of Sciences, Ekaterinburg 620219, Russia
C.P. Yang*
Affiliation:
Faculty of Physics & Electronic Technology, Hubei University, Wuhan 430062, People’s Republic of China; and State Key Laboratory of Metastable Materials Science and Technology, Yanshan University, Qinhuangdao 066004, People’s Republic of China
*
a)Address all correspondence to this author. e-mail: cping_yang@hotmail.com
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Abstract

The temperature dependence of the various electric relaxation times in the perovskite oxide CaCu3Ti4O12 (CCTO) is determined (i) by trap state spectroscopy and (ii) by the dielectric loss function. A similarity in both number and properties of the (i) and (ii) relaxation times was found, suggesting that the dielectric response is strongly correlated with the trap state relaxation, although some differences remain. One or more dipoles developing charged trap states are considered responsible, and the experimental dielectric response of CCTO and Mn substituted CCTO are explored.

Keywords

SemiconductingDielectric PropertiesDefects
Type
Articles
Information
Journal of Materials Research , Volume 26 , Issue 1 , 14 January 2011 , pp. 36 - 44
Copyright
Copyright © Materials Research Society 2011

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