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Chemical solution deposition of lanthanum zirconate barrier layers applied to low-cost coated-conductor fabrication

Published online by Cambridge University Press:  03 March 2011

S. Sathyamurthy*
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
M. Paranthaman
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
H.Y. Zhai
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
S. Kang
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
T. Aytug
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
C. Cantoni
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
K.J. Leonard
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
E.A. Payzant
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
H.M. Christen
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
A. Goyal
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
X. Li
Affiliation:
American Superconductors Inc., Westborough, Massachusetts
U. Schoop
Affiliation:
American Superconductors Inc., Westborough, Massachusetts
T. Kodenkandath
Affiliation:
American Superconductors Inc., Westborough, Massachusetts
M.W. Rupich
Affiliation:
American Superconductors Inc., Westborough, Massachusetts
*
a) Address correspondence to this author. e-mail: sathyamurths\@ornl.gov
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Abstract

Epitaxial lanthanum zirconate (LZO) buffer layers have been grown by sol-gel processing on Ni–W substrates. We report on the application of these oxide films as seed and barrier layers in coated conductor fabrication as potentially simpler, lower cost coated-conductor architecture. The LZO films, about 80–100-nm thick, were found to have dense, crack-free surfaces with high surface crystallinity. Using 0.2-μm YBCO deposited by pulsed laser deposition, a critical current density of 2 MA/cm2 has been demonstrated on the LZO films (YBCO/LZO/Ni–W). Using 0.8-μm YBCO deposited using metal organic decomposition, a critical current density of 1.7 MA/cm2 and a critical current of 135 A/cm have been demonstrated on the LZO barrier layer with a sputtered CeO2 cap layer (YBCO/CeO2/LZO/Ni–W). These results offer promise to replace several of the vacuum-deposited layers in the typical coated conductor architecture (YBCO/CeO2/YSZ/Y2O3/Ni/Ni-W).

Type
Articles
Copyright
Copyright © Materials Research Society 2004

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References

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