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Assessment of Chemical Solution Synthesis and Properties of Gd2Zr2O7 Thin Films as Buffer Layers for Second-Generation High-Temperature Superconductor Wires

Published online by Cambridge University Press:  03 March 2011

T. Aytug
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996
M. Paranthaman
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
K.J. Leonard
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
H.Y. Zhai
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
M.S. Bhuiyan
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
E.A. Payzant
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
A. Goyal
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
S. Sathyamurthy
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
D.B. Beach
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
P.M. Martin
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
D.K. Christen
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
X. Li
Affiliation:
American Superconductor Corp., Westborough, Massachusetts 01581
T. Kodenkandath
Affiliation:
American Superconductor Corp., Westborough, Massachusetts 01581
U. Schoop
Affiliation:
American Superconductor Corp., Westborough, Massachusetts 01581
M.W. Rupich
Affiliation:
American Superconductor Corp., Westborough, Massachusetts 01581
H.E. Smith
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson AFB, Ohio 45433
T. Haugan
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson AFB, Ohio 45433
P.N. Barnes
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson AFB, Ohio 45433
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Abstract

Chemical solution processing of Gd2Zr2O7 (GZO) thin films via sol-gel and metalorganic decomposition (MOD) precursor routes have been studied on textured Ni-based tape substrates. Even though films processed by both techniques showed similar property characteristics, the MOD-derived samples developed a high degree of texture alignment at significantly lower temperatures. Both precursor chemistries resulted in exceptionally dense, pore-free, and smooth microstructures, reflected in the cross-sectional and plan-view high-resolution scanning and transmission electron microscopy studies. On the MOD GZO buffered Ni–3at.% W (Ni–W) substrates with additional CeO2/YSZ sputtered over layers, a 0.8-μm-thick YBa2Cu3O7−δ (YBCO) film, grown by an ex situ metalorganic trifluoroacetate precursor method, yielded critical current, Ic (77 K, self-field), of 100 A/cm width. Furthermore, using pulsed-laser deposited YBCO films, a zero-field superconducting critical current density, Jc (77 K), of 1 × 106 A/cm2 was demonstrated on an all-solution, simplified CeO2(MOD)/GZO(MOD)/Ni–W architecture. The present study establishes GZO buffers as a candidate material for low-cost, all-solution coated conductor fabrication.

Type
Articles
Copyright
Copyright © Materials Research Society 2005

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References

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