Hostname: page-component-84b7d79bbc-4hvwz Total loading time: 0 Render date: 2024-07-25T09:45:24.822Z Has data issue: false hasContentIssue false
  • English
  • Français

Coupled ring resonator for microwave characterization of dielectric materials

Published online by Cambridge University Press:  05 January 2012

Mahima Kapoor ,
K. S. Daya  and
G. S. Tyagi
Mahima Kapoor
Affiliation:
Microwave Physics Lab, Department of Physics and Computer Science, Faculty of Science, Dayalbagh Educational Institute, Agra 282110, India
K. S. Daya*
Affiliation:
Microwave Physics Lab, Department of Physics and Computer Science, Faculty of Science, Dayalbagh Educational Institute, Agra 282110, India
G. S. Tyagi
Affiliation:
Microwave Physics Lab, Department of Physics and Computer Science, Faculty of Science, Dayalbagh Educational Institute, Agra 282110, India
*
Corresponding author: K. S. Daya Email: sdayak@gmail.com
Get access Rights & Permissions [Opens in a new window]

Abstract

In this paper characterization of dielectric materials in liquid and powder phase using concentric closed and split ring resonators of length λ, λ/2, and λ/4 is reported. Experimental results have been validated by simulations and theoretically modeling. Sensitivity of the resonator with closed rings was maximum. Experimentally extracted values of dielectric constant of ferrite ranged from 14.05 to 15.1 with closed ring resonators and from 13.6 to 14.02 with split ring resonator, respectively. For spirulina platensis the dielectric constant was lying in the range 1.78–1.93 and 1.74–2.04 with closed ring and split ring resonators, respectively. The values extracted experimentally are in good agreement with simulation and theoretically found values. However, the values obtained from closed ring resonator were in agreement with the dielectric constant values of ferrite and spirulina platensis.

Keywords

Dielectric constantRing resonatorResonant frequency
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 4 , Special Issue 2: Special issue on Surveillance Systems for Air Navigation Services , April 2012 , pp. 241 - 246
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1]Kheir, M.S.; Hammad, H.F.: Measurement of the dielectric constant of liquid using a hybrid cavity ring resonator, in PIERS Proc., Cambridge, USA, July 2008.Google Scholar
[2]Sheen, J.: Amendment of cavity perturbation technique for loss tangent measurement at microwave frequencies. J. Appl. Phys., 102 (2007), 014102.CrossRefGoogle Scholar
[3]Pozar, D.M.: Microwave Engineering, 3rd ed., Wiley & Sons, Hoboken, New Jersey 2004.Google Scholar
[4]Sheen, J.: Measurements of microwave dielectric properties by an amended cavity perturbation techniques. Measurement, 42 (2009), 57–61.CrossRefGoogle Scholar
[5]Chang, K.: Microwave Ring Circuits and Antennas, John Wiley & Sons, Hoboken, New Jersey, 1996.Google Scholar
[6]Jaime, L. et al. : Separation and characterization of antioxidants from Spirulina platensis microalgae combining pressurized liquid extraction, TLC and HPLC-DAD. J. Sep. Sci., 28 (16) (2005), 2111–2119.CrossRefGoogle ScholarPubMed
[7]Dubey, A.: Tyagi, G.S.; Srivastava, G.P.; Badola, N.K.; Jain, K.K.: Effect of temperature on LiMnTi ferrite based microstrip circulator. Microw. Opt. Technol. Lett., 35 (2) (2002), 114–117.CrossRefGoogle Scholar
[8]Lobato-Morales, H.; Corona-Chávez, A.; Murthy, D.V.B.; Olvera-Cervantes, J.L.: Complex permittivity measurements using cavity perturbation technique with substrate integrated waveguide cavities. Rev. Sci. Instrum., 81 (2010), 064704.Google Scholar
[9]Balmus, S.B.; Pascariu, G.N.; Creanga, F.; Dumitru, I.; Sandu, D.D.: The cavity perturbation method for the measurement of the relative dielectric permittivity in the microwave range. J. Optoelectron. Adv. Mater., 8 (3) (2006), 971–977.Google Scholar
[10]Krupkay, J.; Derzakowskiz, K.; Riddlex, B.; Baker-Jarvis, J.: A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature. Meas. Sci. Tech., 9 (1998), 1751–1756.CrossRefGoogle Scholar