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Advances in X-ray Analysis, Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990

Volume 34 - 1990

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I. Surface and Near-Surface X-Ray Spectroscopy

II. Determination of Low Concentration Levels by X-Ray Spectrometry

III. Long-Wavelength X-Ray Spectrometry

IV. XRF Data Reduction

V. XRF Instrumentation and Techniques

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