6717 results in Condensed Matter Physics, Nanoscience and Mesoscopic Physics
5 - Spectra of ions in crystals
-
- Book:
- Crystal-Field Engineering of Solid-State Laser Materials
- Published online:
- 24 September 2009
- Print publication:
- 17 July 2000, pp 134-176
-
- Chapter
- Export citation
Contents
-
- Book:
- Crystal-Field Engineering of Solid-State Laser Materials
- Published online:
- 24 September 2009
- Print publication:
- 17 July 2000, pp vii-xii
-
- Chapter
- Export citation
5 - Low-temperature scanning electron microscopy
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 103-124
-
- Chapter
- Export citation
Frontmatter
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp i-iv
-
- Chapter
- Export citation
Contents
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp v-ix
-
- Chapter
- Export citation
6 - Scanning tunneling microscopy
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 125-160
-
- Chapter
- Export citation
10 - Grain boundaries in high Tc materials: transport properties and structure
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 235-262
-
- Chapter
- Export citation
7 - Identification of new superconducting compounds by electron microscopy
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 161-192
-
- Chapter
- Export citation
4 - Specimen preparation for transmission electron microscopy
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 69-102
-
- Chapter
- Export citation
2 - Holography in the transmission electron microscope
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 23-38
-
- Chapter
- Export citation
Preface
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp xiii-xiv
-
- Chapter
- Export citation
11 - The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7–δ
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 263-284
-
- Chapter
- Export citation
8 - Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 193-214
-
- Chapter
- Export citation
Characterization of High Tc Materials and Devices by Electron Microscopy
-
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000
List of contributors
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp x-xii
-
- Chapter
- Export citation
1 - High-resolution transmission electron microscopy
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 1-22
-
- Chapter
- Export citation
14 - Controlling the structure and properties of high Tc thin-film devices
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 355-391
-
- Chapter
- Export citation
9 - Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 215-234
-
- Chapter
- Export citation
13 - Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 319-354
-
- Chapter
- Export citation
3 - Microanalysis by scanning transmission electron microscopy
-
-
- Book:
- Characterization of High Tc Materials and Devices by Electron Microscopy
- Published online:
- 21 August 2009
- Print publication:
- 06 July 2000, pp 39-68
-
- Chapter
- Export citation