Book contents
- Frontmatter
- Contents
- Preface to the second English edition
- Preface to the first edition
- Introduction
- 1 Abbe's sine condition
- 2 Fourier optics
- 3 Effect of polarization on diffraction in systems of high numerical aperture
- 4 Gaussian beam optics
- 5 Coherent and incoherent imaging
- 6 First-order temporal coherence in classical optics
- 7 The van Cittert–Zernike theorem
- 8 Partial polarization, Stokes parameters, and the Poincaré sphere
- 9 Second-order coherence and the Hanbury Brown–Twiss experiment
- 10 What in the world are surface plasmons?
- 11 Surface plasmon polaritons on metallic surfaces
- 12 The Faraday effect
- 13 The magneto-optical Kerr effect
- 14 The Sagnac interferometer
- 15 Fabry–Pérot etalons in polarized light
- 16 The Ewald–Oseen extinction theorem
- 17 Reciprocity in classical linear optics
- 18 Optical pulse compression
- 19 The uncertainty principle in classical optics
- 20 Omni-directional dielectric mirrors
- 21 Linear optical vortices
- 22 Geometric-optical rays, Poynting's vector, and the field momenta
- 23 Doppler shift, stellar aberration, and convection of light by moving media
- 24 Diffraction gratings
- 25 Diffractive optical elements
- 26 The Talbot effect
- 27 Some quirks of total internal reflection
- 28 Evanescent coupling
- 29 Internal and external conical refraction
- 30 Transmission of light through small elliptical apertures
- 31 The method of Fox and Li
- 32 The beam propagation method
- 33 Launching light into a fiber
- 34 The optics of semiconductor diode lasers
- 35 Michelson's stellar interferometer
- 36 Bracewell's interferometric telescope
- 37 Scanning optical microscopy
- 38 Zernike's method of phase contrast
- 39 Polarization microscopy
- 40 Nomarski's differential interference contrast microscope
- 41 The van Leeuwenhoek microscope
- 42 Projection photolithography
- 43 Interaction of light with subwavelength structures
- 44 The Ronchi test
- 45 The Shack–Hartmann wavefront sensor
- 46 Ellipsometry
- 47 Holography and holographic interferometry
- 48 Self-focusing in nonlinear optical media
- 49 Spatial optical solitons
- 50 Laser heating of multilayer stacks
- Index
- References
1 - Abbe's sine condition
Published online by Cambridge University Press: 31 January 2011
- Frontmatter
- Contents
- Preface to the second English edition
- Preface to the first edition
- Introduction
- 1 Abbe's sine condition
- 2 Fourier optics
- 3 Effect of polarization on diffraction in systems of high numerical aperture
- 4 Gaussian beam optics
- 5 Coherent and incoherent imaging
- 6 First-order temporal coherence in classical optics
- 7 The van Cittert–Zernike theorem
- 8 Partial polarization, Stokes parameters, and the Poincaré sphere
- 9 Second-order coherence and the Hanbury Brown–Twiss experiment
- 10 What in the world are surface plasmons?
- 11 Surface plasmon polaritons on metallic surfaces
- 12 The Faraday effect
- 13 The magneto-optical Kerr effect
- 14 The Sagnac interferometer
- 15 Fabry–Pérot etalons in polarized light
- 16 The Ewald–Oseen extinction theorem
- 17 Reciprocity in classical linear optics
- 18 Optical pulse compression
- 19 The uncertainty principle in classical optics
- 20 Omni-directional dielectric mirrors
- 21 Linear optical vortices
- 22 Geometric-optical rays, Poynting's vector, and the field momenta
- 23 Doppler shift, stellar aberration, and convection of light by moving media
- 24 Diffraction gratings
- 25 Diffractive optical elements
- 26 The Talbot effect
- 27 Some quirks of total internal reflection
- 28 Evanescent coupling
- 29 Internal and external conical refraction
- 30 Transmission of light through small elliptical apertures
- 31 The method of Fox and Li
- 32 The beam propagation method
- 33 Launching light into a fiber
- 34 The optics of semiconductor diode lasers
- 35 Michelson's stellar interferometer
- 36 Bracewell's interferometric telescope
- 37 Scanning optical microscopy
- 38 Zernike's method of phase contrast
- 39 Polarization microscopy
- 40 Nomarski's differential interference contrast microscope
- 41 The van Leeuwenhoek microscope
- 42 Projection photolithography
- 43 Interaction of light with subwavelength structures
- 44 The Ronchi test
- 45 The Shack–Hartmann wavefront sensor
- 46 Ellipsometry
- 47 Holography and holographic interferometry
- 48 Self-focusing in nonlinear optical media
- 49 Spatial optical solitons
- 50 Laser heating of multilayer stacks
- Index
- References
Summary
Ernst Abbe (1840–1905), professor of physics and mathematics at the University of Jena, Germany, and major partner in the Carl Zeiss company, made important contributions to the theory and practice of optical microscopy. His compound microscope was a superb optical design based on a theoretical understanding of diffraction and minimization of the effects of aberrations. Abbe enunciated his famous sine condition regarding the axial point in the object plane of a centered image-forming system such as a microscope or a telescope. When this condition is satisfied, “aberration-free” imaging of the object points located in the vicinity of the optical axis is assured. This chapter provides an heuristic description of the sine condition, which, in the words of Conrady, is “one of the most remarkable and labor-saving theorems in the whole realm of applied optics”.
As the chapter follows a rather unconventional approach towards explaining the sine condition, it is worthwhile to highlight its main features at the outset. An introduction of the necessary geometric-optical concepts provides the basis for defining the sine condition. This is followed by establishing, for an axial object point, a one-to-one mapping between the principal planes of the imaging system. The wavefront entering the system at the first principal plane (p.p.) is thus related to that emerging from the second p.p.
To describe the imaging of near-axis regions, we switch to a wave-optical viewpoint.
- Type
- Chapter
- Information
- Classical Optics and its Applications , pp. 9 - 22Publisher: Cambridge University PressPrint publication year: 2009
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