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5 - How ASAT Might Be Achieved

from Core Section

Published online by Cambridge University Press:  03 March 2022

Thomas F. Kelly ,
Brian P. Gorman  and
Simon P. Ringer
Thomas F. Kelly
Affiliation:
Steam Instruments, Inc.
Brian P. Gorman
Affiliation:
Colorado School of Mines
Simon P. Ringer
Affiliation:
University of Sydney
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Summary

Based on our preceding discussions of atomic-resolution characterization techniques in Chapter 4, no technique has yet achieved ASAT. Combining information from FIM or (S)TEM along with APT has demonstrated some very promising results, and each combination seems to be a likely path toward ASAT. In this chapter, we propose how ASAT might be achieved using correlative and/or combined techniques such as (S)TEM + APT. Such a combination would allow several routes for determination of the ion transfer function, or how imaging occurs during an APT experiment. If we can determine the transfer function with high-enough fidelity, we make the argument that it should be possible to achieve ASAT using a combination of (S)TEM and APT with inputs from simulations.

Keywords

instrument transfer functionspecimen transfer functiontrajectory aberrationsinstrument projection surfaceSTEM-centric atom positioningAPT-centric atom positioningdifferential phase contrastFourier transformholographic imagingBas protocol
Type
Chapter
Information
Atomic-Scale Analytical Tomography
Concepts and Implications
 , pp. 77 - 97
Publisher: Cambridge University Press
Print publication year: 2022

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References

Bas, P., Bostel, A., Deconihout, B., and Blavette, D., “A General Protocol for the Reconstruction of 3D Atom Probe Data,” Appl. Surf. Sci., vol. 87/88, pp. 298–304, 1995.CrossRefGoogle Scholar
Miller, M. K., “Atom Probe Tomography,” in Microscopy for Nanotechnology, 2004.Google Scholar
Larson, D. J., Gault, B., Geiser, B. P., De Geuser, F., and Vurpillot, F., “Atom Probe Tomography Spatial Reconstruction: Status and Directions,” Curr. Opin. Solid State Mater. Sci., vol. 17, no. 5, pp. 236–247, Oct. 2013, doi: https://doi.org/10.1016/j.cossms.2013.09.002.Google Scholar
Lefebvre, W., Vurpillot, F., and Sauvage, X., Atom Probe Tomography: Put Theory into Practice. London: Academic Press, 2016.Google Scholar
Cerezo, A., Warren, P. J., and Smith, G. D. W., “Some Aspects of Image Projection in the Field-Ion Microscope,” Ultramicroscopy, vol. 79, pp. 251–257, 1999.Google Scholar
Larson, D. J., Geiser, B. P., Prosa, T. J., Ulfig, R., and Kelly, T. F., “Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data,” Microsc. Microanal., vol. 17, no. S2, pp. 740–741, 2011.CrossRefGoogle Scholar
Gomer, R. and Swanson, L. W., “Theory of Field Desorption,” J. Chem. Phys., vol. 38, no. 7, pp. 1613–1629, 1963.CrossRefGoogle Scholar
Gomer, R., “Field Emission, Field Ionization, and Field Desorption,” Surf. Sci., vol. 299/300, pp. 129–152, 1994.Google Scholar
Kirchhofer, R. et al., “Quantifying Compositional Homogeneity in Pb(Zr,Ti)O3 Using Atom Probe Tomography,” J. Am. Ceram. Soc., vol. 97, no. 9, pp. 2677–2697, 2014, doi: https://doi.org/10.1111/jace.13135.Google Scholar
Wilkes, T. D., Smith, G. D. W., and Smith, D. A., “On the Quantitative Analysis of Field-Ion Micrographs,” Metallography, vol. 7, pp. 403–430, 1974.Google Scholar
Vurpillot, F., Gilbert, M., and Deconihout, B., “Towards the Three-Dimensional Field Ion Microscope,” Surf. Interface Anal., vol. 39, no. 2–3, pp. 273–277, 2007.CrossRefGoogle Scholar
Dagan, M., Gault, B., Smith, G. D. W., Bagot, P. A. J., and Moody, M. P., “Automated Atom-by-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data,” Microsc. Microanal., vol. 23, no. 2, pp. 255–268, 2017, doi: https://doi.org/10.1017/S1431927617000277.Google Scholar
Kelly, T. F., “Kinetic-Energy Discrimination for Atom Probe Tomography,” Micros. Microanal., vol. 17, no. 1, pp. 1–14, 2011.Google Scholar
Fleischmann, C., Paredis, K., Melkonyan, D., and Vandervorst, W., “Revealing the 3-Dimensional Shape of Atom Probe Tips by Atomic Force Microscopy,” Ultramicroscopy, vol. 194, pp. 221–226, Nov. 2018, doi: https://doi.org/10.1016/j.ultramic.2018.08.010.Google Scholar
Williams, D. B. and Carter, C. B., Transmission Electron Microscopy, 2nd ed., 4 vols. New York, NY: Springer, 2009.Google Scholar
Katnagallu, S. et al., “Imaging Individual Solute Atoms at Crystalline Imperfections in Metals,” New J. Phys., vol. 21, no. 12, p. 123020, Dec. 2019, doi: https://doi.org/10.1088/1367-2630/ab5cc4.Google Scholar
Liddicoat, P. V., “Systems and Methods for Using Multimodal Imaging to Determine Structure and Atomic Composition of Specimens.” US Patent: US10121636B2, Nov. 6, 2018.Google Scholar
Ceguerra, A. V., Gorman, B. P., Breen, A. J., and Ringer, S. P., “Method for Constructing ASAT Images,” unpublished research, 2020.Google Scholar
Gorman, B. P., Diercks, D., Salmon, N. et al., “Hardware and Techniques for Cross-Correlative TEM and Atom Probe Analysis,” Micros. Today, vol. 16, no. 4, pp. 42–47, 2008.CrossRefGoogle Scholar
Thompson, K., Lawrence, D. J., Larson, D. J. et al., “In-Situ Site-Specific Specimen Preparation for Atom Probe Tomography,” Ultramicroscopy, vol. 107, no. 2–3, pp. 131–139, 2007.CrossRefGoogle ScholarPubMed
Zheng, F., Migunov, V., Caron, J. et al., “Three-Dimensional Electric Field Mapping of an Electrically Biased Atom Probe Needle Using Off-Axis Electron Holography,” Micros. Microanal., vol. 25, no. S2, pp. 326–327, 2019, doi: https://doi.org/10.1017/S1431927619002368.CrossRefGoogle Scholar
Wu, M., Tafel, A., Hommelhoff, P., and Spiecker, E., “Determination of 3D Electrostatic Field at an Electron Nano-emitter,” Appl. Phys. Lett., vol. 114, no. 1, p. 013101, Jan. 2019, doi: https://doi.org/10.1063/1.5055227.Google Scholar
Gorman, B. P., “Systems and Methods of Aberration Correction for Atom Probe Tomography.” US Patent: US20190318907A1, Oct. 17, 2019.Google Scholar
Diercks, D. R. and Gorman, B. P., “Nanoscale Measurement of Laser-Induced Temperature Rise and Field Evaporation Effects in CdTe and GaN,” J. Phys. Chem. C, vol. 119, no. 35, pp. 20623–20631, Sep. 2015, doi: https://doi.org/10.1021/acs.jpcc.5b02126.CrossRefGoogle Scholar
Vurpillot, F., Gault, B., Geiser, B. P., and Larson, D. J., “Reconstructing Atom Probe Data: A Review,” Ultramicroscopy, vol. 132, pp. 19–30, Sep. 2013, doi: https://doi.org/10.1016/j.ultramic.2013.03.010.Google Scholar
Diercks, D. R. and Gorman, B. P., “Self-Consistent Atom Probe Tomography Reconstructions Utilizing Electron Microscopy,” Ultramicroscopy, vol. 195, pp. 32–46, Dec. 2018, doi: https://doi.org/10.1016/j.ultramic.2018.08.019.Google Scholar
Petersen, T. C. and Ringer, S. P., “Electron Tomography Using a Geometric Surface-Tangent Algorithm: Application to Atom Probe Specimen Morphology,” J. Appl. Phys., vol. 105, p. 103518, 2009.Google Scholar
Petersen, T. C. and Ringer, S. P., “An Electron Tomography Algorithm for Reconstructing 3D Morphology Using Surface Tangents of Projected Scattering Interfaces,” Comput. Phys. Commun., vol. 181, no. 3, pp. 676–682, 2010.CrossRefGoogle Scholar
Ren, D., Ophus, C., Chen, M., and Waller, L., “A Multiple Scattering Algorithm for Three Dimensional Phase Contrast Atomic Electron Tomography,” Ultramicroscopy, vol. 208, p. 112860, Jan. 2020, doi: https://doi.org/10.1016/j.ultramic.2019.112860.Google Scholar
Haley, D., Petersen, T., Ringer, S. P., and Smith, G. D. W., “Atom Probe Trajectory Mapping Using Experimental Tip Shape Measurements,” J. Microsc., vol. 244, no. 2, pp. 170–180, Nov. 2011, doi: https://doi.org/10.1111/j.1365-2818.2011.03522.x.Google Scholar
Haley, D., Moody, M. P., and Smith, G. D. W., “Level Set Methods for Modelling Field Evaporation in Atom Probe,” Microsc. Microanal., vol. 19, no. 6, pp. 1709–1717, 2013.CrossRefGoogle ScholarPubMed
Vurpillot, F., Bostel, A., and Blavette, D., “The Shape of Field Emitters and the Ion Trajectories in Three-Dimensional Atom Probes,” J. Microsc., vol. 196, no. 3, pp. 332–336, Apr. 1999.CrossRefGoogle ScholarPubMed
Vurpillot, F., “Etude de la Fonction de Transfert Point-Image de la Sonde Atomique Tomographique,” University of Rouen, Rouen, 2001.Google Scholar
Geiser, B. P. et al., “A System for Simulation of Tip Evolution under Field Evaporation,” Micros. Microanal., vol. 15, no. S2, pp. 302–303, 2009.Google Scholar
Oberdorfer, C., Eich, S. M., and Schmitz, G., “A Full-Scale Simulation Approach for Atom Probe Tomography,” Ultramicroscopy, vol. 128, pp. 55–67, 2013, doi: https://doi.org/10.1016/j.ultramic.2013.01.005.CrossRefGoogle ScholarPubMed
Marquis, E. A., Geiser, B. P., Prosa, T. J., and Larson, D. J., “Evolution of Tip Shape during Field Evaporation of Complex Multilayer Structures,” J. Microsc., vol. 241, no. 3, pp. 225–233, 2011.Google Scholar
Kelly, T. F., Miller, M. K., Rajan, K., and Ringer, S. P., “Atomic-Scale Tomography: A 2020 Vision,” Micros. Microanal., vol. 19, no. 3, pp. 652–664, 2013.CrossRefGoogle ScholarPubMed

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